{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T06:30:27Z","timestamp":1764570627292,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,12]]},"DOI":"10.1109\/icecs.2015.7440348","type":"proceedings-article","created":{"date-parts":[[2016,3,30]],"date-time":"2016-03-30T00:53:22Z","timestamp":1459299202000},"page":"462-465","source":"Crossref","is-referenced-by-count":1,"title":["Impact of technology scaling on the minimum energy point for FinFET based flip-flops"],"prefix":"10.1109","author":[{"given":"Osama","family":"Abdelkader","sequence":"first","affiliation":[]},{"given":"Hassan","family":"Mostafa","sequence":"additional","affiliation":[]},{"given":"Hamdy","family":"Abdelhamid","sequence":"additional","affiliation":[]},{"given":"Ahmed","family":"Soliman","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2333660.2333666"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228414"},{"key":"ref12","article-title":"Effects of FinFET Technology Scaling on 3T and 3TID Cell Performance Under Process and Environmental Variations, 3rd Workshop on Workshop on Resilient Architectures","author":"jaksic","year":"2012","journal-title":"conjunction with the 45th Annual IEEE\/"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2013.2238542"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ASQED.2009.5206288"},{"journal-title":"Predictive Technology Model (PTM)","year":"0","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2006.1705211"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2010.5703430"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2009.5424367"},{"key":"ref19","first-page":"14","article-title":"Sub-25nm _nfet with advanced fin formation and short channel e_ect engineering","author":"yamashita","year":"2011","journal-title":"VLSIT"},{"key":"ref4","article-title":"Reduction of direct-tunneling gate leakage current in double-gate and ultra-thin body MOSFETs","author":"chang","year":"0","journal-title":"IEDM 2001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IGCC.2014.7039170"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2002.807392"},{"key":"ref5","article-title":"FinFET scaling to 10 nm gate length","author":"yu","year":"0","journal-title":"IEDM 2002"},{"year":"2013","key":"ref8","article-title":"International Technology Roadmap of Semiconductors"},{"key":"ref7","article-title":"A 3-D Analytical Physically-Based Model for SCEs in Undoped FinFETs","volume":"54","author":"abd-elhamid","year":"2007","journal-title":"IEEE Transactions on Electron Devices"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.848109"},{"key":"ref1","article-title":"Analytical predictive modeling for the study of the scalability limits of multiple gate MOSFETs","volume":"51","author":"abd-elhamid","year":"2007","journal-title":"Solid-state Electronics Journal"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CCECE.2014.6900947"}],"event":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","start":{"date-parts":[[2015,12,6]]},"location":"Cairo, Egypt","end":{"date-parts":[[2015,12,9]]}},"container-title":["2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7430153\/7440163\/07440348.pdf?arnumber=7440348","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:41:34Z","timestamp":1490078494000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7440348\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/icecs.2015.7440348","relation":{},"subject":[],"published":{"date-parts":[[2015,12]]}}}