{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T15:21:45Z","timestamp":1761060105532,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,12]]},"DOI":"10.1109\/icecs.2015.7440403","type":"proceedings-article","created":{"date-parts":[[2016,3,29]],"date-time":"2016-03-29T20:53:22Z","timestamp":1459284802000},"page":"661-664","source":"Crossref","is-referenced-by-count":1,"title":["An evaluation of BTI degradation of 32nm standard cells"],"prefix":"10.1109","author":[{"given":"Rafael B.","family":"Schivittz","sequence":"first","affiliation":[]},{"given":"Cristina","family":"Meinhardt","sequence":"additional","affiliation":[]},{"given":"Paulo F.","family":"Butzen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2010.5703295"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.07.087"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2008.4523231"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2036628"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2040125"},{"key":"ref3","first-page":"270","article-title":"The NBTI in MOS Devices: A Review Microelectronics Reliability","volume":"46","author":"stathis","year":"2006"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147172"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2164543"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2008.4771808"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.244119"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1149\/1.3572281"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.10.012"}],"event":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","start":{"date-parts":[[2015,12,6]]},"location":"Cairo","end":{"date-parts":[[2015,12,9]]}},"container-title":["2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7430153\/7440163\/07440403.pdf?arnumber=7440403","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T08:01:02Z","timestamp":1490083262000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7440403\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/icecs.2015.7440403","relation":{},"subject":[],"published":{"date-parts":[[2015,12]]}}}