{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T20:42:27Z","timestamp":1772224947465,"version":"3.50.1"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,12]]},"DOI":"10.1109\/icecs.2017.8292033","type":"proceedings-article","created":{"date-parts":[[2018,2,22]],"date-time":"2018-02-22T21:14:16Z","timestamp":1519334056000},"page":"86-89","source":"Crossref","is-referenced-by-count":5,"title":["Low-voltage low-distortion sampling switch design in 22 nm FD-SOI CMOS technology"],"prefix":"10.1109","author":[{"given":"Pragoti Pran","family":"Bora","sequence":"first","affiliation":[{"name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT, Munich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Borggreve","sequence":"additional","affiliation":[{"name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT, Munich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Frank","family":"Vanselow","sequence":"additional","affiliation":[{"name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT, Munich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Erkan","family":"Isa","sequence":"additional","affiliation":[{"name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT, Munich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Linus","family":"Maurer","sequence":"additional","affiliation":[{"name":"University of Bundeswehr, Department of Microelectronics and Circuit Design, Neubiberg, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/el:19990028"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1999.780611"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746275"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2014.7050059"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2042254"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838029"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICVC.1999.820929"}],"event":{"name":"2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","location":"Batumi, Georgia","start":{"date-parts":[[2017,12,5]]},"end":{"date-parts":[[2017,12,8]]}},"container-title":["2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8283844\/8291994\/08292033.pdf?arnumber=8292033","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,8]],"date-time":"2021-06-08T10:06:24Z","timestamp":1623146784000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8292033\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/icecs.2017.8292033","relation":{},"subject":[],"published":{"date-parts":[[2017,12]]}}}