{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T19:30:40Z","timestamp":1725737440668},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/icecs.2018.8617838","type":"proceedings-article","created":{"date-parts":[[2019,1,24]],"date-time":"2019-01-24T05:16:09Z","timestamp":1548306969000},"page":"425-428","source":"Crossref","is-referenced-by-count":2,"title":["A Domain-specific Language for Automated Fault Injection in SystemC Models"],"prefix":"10.1109","author":[{"given":"Douglas","family":"Lohmann","sequence":"first","affiliation":[]},{"given":"Alexis","family":"Huf","sequence":"additional","affiliation":[]},{"given":"Djones","family":"Lettnin","sequence":"additional","affiliation":[]},{"given":"Frank","family":"Siqueira","sequence":"additional","affiliation":[]},{"given":"Jose Luis","family":"Guntzel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2008.25"},{"key":"ref3","first-page":"1","article-title":"Analyzing dependability measures at the electronic system level","author":"michael","year":"2011","journal-title":"Specification and Design Languages (FDL) 2011 Forum on"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2012.09.005"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2007.4341528"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2008.35"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2008.4484036"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS.2018.8399945"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SYSOSE.2017.7994955"},{"journal-title":"A Practical Guide to Adopting the Universal Verification Methodology (UVM)","year":"2013","author":"rosenberg","key":"ref1"}],"event":{"name":"2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","start":{"date-parts":[[2018,12,9]]},"location":"Bordeaux","end":{"date-parts":[[2018,12,12]]}},"container-title":["2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8599658\/8617837\/08617838.pdf?arnumber=8617838","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T01:13:09Z","timestamp":1598231589000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8617838\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/icecs.2018.8617838","relation":{},"subject":[],"published":{"date-parts":[[2018,12]]}}}