{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T16:40:16Z","timestamp":1776530416347,"version":"3.51.2"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/icecs.2018.8617996","type":"proceedings-article","created":{"date-parts":[[2019,1,24]],"date-time":"2019-01-24T05:16:09Z","timestamp":1548306969000},"page":"361-364","source":"Crossref","is-referenced-by-count":16,"title":["Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates"],"prefix":"10.1109","author":[{"given":"Marko","family":"Andjelkovic","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Milan","family":"Babic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuanqing","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Oliver","family":"Schrape","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Milos","family":"Krstic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rolf","family":"Kraemer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2005.61"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.41"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.35"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DSNW.2010.5542610"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-009-5103-9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1982.4336490"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/23.903813"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-011-0212-8"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.30"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/SBCCI.2000.876036"},{"key":"ref5","article-title":"Transistor Sizing and Folding Techniques for Radiation Hardening","author":"kastendsmit","year":"2009","journal-title":"Proc 7th European Conf Radiation and Its Effects on Components and Systems (RADECS)"},{"key":"ref8","article-title":"Combinational Logic Soft Error Analysis and Protection","author":"nieuwland","year":"2007","journal-title":"Proc IEEE Int Online Test Symposium (IOLTS)"},{"key":"ref7","article-title":"Gate Sizing to Radiation Harden Combinational Logic","author":"zhou","year":"2006","journal-title":"Proc IEEE Trans on Computer-aided Design"},{"key":"ref2","article-title":"Estimating Single-Event Logic Cross Sections in Advanced Technologies","volume":"64","author":"harrington","year":"2017","journal-title":"IEEE Trans on Nuclear Science"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255624"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147105"}],"event":{"name":"2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","location":"Bordeaux","start":{"date-parts":[[2018,12,9]]},"end":{"date-parts":[[2018,12,12]]}},"container-title":["2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8599658\/8617837\/08617996.pdf?arnumber=8617996","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T02:01:23Z","timestamp":1598234483000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8617996\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/icecs.2018.8617996","relation":{},"subject":[],"published":{"date-parts":[[2018,12]]}}}