{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T09:04:14Z","timestamp":1725699854639},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,24]],"date-time":"2022-10-24T00:00:00Z","timestamp":1666569600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,24]],"date-time":"2022-10-24T00:00:00Z","timestamp":1666569600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,24]]},"DOI":"10.1109\/icecs202256217.2022.9970771","type":"proceedings-article","created":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T19:50:02Z","timestamp":1670874602000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Mitigating the Impact of Variability in NCFET-based Coupled-Oscillator Networks Applications"],"prefix":"10.1109","author":[{"given":"Juan","family":"Nunez","sequence":"first","affiliation":[{"name":"Instituto de Microelectr&#x00F3;nica de Sevilla, IMSE-CNM (CSIC\/Universidad de Sevilla),Seville,Spain,41092"}]},{"given":"Simon","family":"Thomann","sequence":"additional","affiliation":[{"name":"University of Stuttgart,Semiconductor Test and Reliability (STAR),Germany"}]},{"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[{"name":"University of Stuttgart,Semiconductor Test and Reliability (STAR),Germany"}]},{"given":"Maria J.","family":"Avedillo","sequence":"additional","affiliation":[{"name":"Instituto de Microelectr&#x00F3;nica de Sevilla, IMSE-CNM (CSIC\/Universidad de Sevilla),Seville,Spain,41092"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2754138"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614586"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2902107"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9180917"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2020.3027541"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2990672"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.4906783"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2016.7841128"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.5120412"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-18445-1"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSICircuits18222.2020.9162869"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.2972006"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/9781119069225.ch2-3"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2018.2878854"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.82.2983"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993460"}],"event":{"name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","start":{"date-parts":[[2022,10,24]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2022,10,26]]}},"container-title":["2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9970762\/9970770\/09970771.pdf?arnumber=9970771","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,23]],"date-time":"2023-01-23T20:01:03Z","timestamp":1674504063000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9970771\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,24]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/icecs202256217.2022.9970771","relation":{},"subject":[],"published":{"date-parts":[[2022,10,24]]}}}