{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T05:38:04Z","timestamp":1774935484133,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,24]],"date-time":"2022-10-24T00:00:00Z","timestamp":1666569600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,24]],"date-time":"2022-10-24T00:00:00Z","timestamp":1666569600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,24]]},"DOI":"10.1109\/icecs202256217.2022.9970887","type":"proceedings-article","created":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T19:50:02Z","timestamp":1670874602000},"page":"1-4","source":"Crossref","is-referenced-by-count":7,"title":["Ultrasound Non-Destructive Evaluation\/Testing using Capacitive Micromachined Ultrasound Transducer (CMUT)"],"prefix":"10.1109","author":[{"given":"Mohamed","family":"Abdalla","sequence":"first","affiliation":[{"name":"James Watt School of Engineering, University of Glasgow,United Kingdom,G12 8QQ"}]},{"given":"Meraj","family":"Ahmad","sequence":"additional","affiliation":[{"name":"James Watt School of Engineering, University of Glasgow,United Kingdom,G12 8QQ"}]},{"given":"James FC","family":"Windmill","sequence":"additional","affiliation":[{"name":"University of Strathclyde,Department of Electronic and Electrical Engineering,Glasgow,United Kingdom,G1 1XW"}]},{"given":"Sandy","family":"Cochran","sequence":"additional","affiliation":[{"name":"James Watt School of Engineering, University of Glasgow,United Kingdom,G12 8QQ"}]},{"given":"Hadi","family":"Heidari","sequence":"additional","affiliation":[{"name":"James Watt School of Engineering, University of Glasgow,United Kingdom,G12 8QQ"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/58.920706"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/5298197"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmu.2012.02.001"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0893-1321(2003)16:2(76)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-018-4131-8"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3007068"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEACon51066.2021.9654506"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/19.126639"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2016.2567641"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2002.1049742"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2016.2620425"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2012.2351"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/84.749409"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/mi5030420"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/nano.202000242"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/EMBC46164.2021.9630342"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/mi10020152"}],"event":{"name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","location":"Glasgow, United Kingdom","start":{"date-parts":[[2022,10,24]]},"end":{"date-parts":[[2022,10,26]]}},"container-title":["2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9970762\/9970770\/09970887.pdf?arnumber=9970887","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,23]],"date-time":"2023-01-23T20:00:51Z","timestamp":1674504051000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9970887\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,24]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/icecs202256217.2022.9970887","relation":{},"subject":[],"published":{"date-parts":[[2022,10,24]]}}}