{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T15:31:52Z","timestamp":1759332712075,"version":"3.44.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/icecs46596.2019.8964702","type":"proceedings-article","created":{"date-parts":[[2020,1,23]],"date-time":"2020-01-23T22:15:31Z","timestamp":1579817731000},"page":"674-677","source":"Crossref","is-referenced-by-count":12,"title":["MRL Crossbar-Based Full Adder Design"],"prefix":"10.1109","author":[{"given":"Khaled Alhaj","family":"Ali","sequence":"first","affiliation":[{"name":"Lebanese University,Faculty of Sciences,Physics Department,Beirut,Lebanon"}]},{"given":"Mostafa","family":"Rizk","sequence":"additional","affiliation":[{"name":"Lebanese University,Faculty of Sciences,Physics Department,Beirut,Lebanon"}]},{"given":"Amer","family":"Baghdadi","sequence":"additional","affiliation":[{"name":"Institut Mines-Telecom, IMT Atlantique, Lab-STICC CNRS UMR 6285,Brest,France"}]},{"given":"Jean-Philippe","family":"Diguet","sequence":"additional","affiliation":[{"name":"Lab-STICC CNRS UMR 6285, Université de Bretagne-Sud,Lorient,France"}]},{"given":"Jalal","family":"Jomaah","sequence":"additional","affiliation":[{"name":"Lebanese University,Faculty of Sciences,Physics Department,Beirut,Lebanon"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1587\/elex.12.20150062"},{"key":"ref11","article-title":"Finding the missing memristor","author":"williams","year":"2010","journal-title":"Keynote talk at UC San Diego CNS Winter"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2012.240"},{"key":"ref13","article-title":"Low power and high speed switching of Ti-doped NiO ReRAM under the unipolar voltage source of less than 3V","author":"tsunoda","year":"0","journal-title":"IEEE Int Electron Device Meeting (IEDM)"},{"key":"ref14","article-title":"Evidence and solution of over-reset problem for HfOx based resistive memory with Sub-ns switching speed and high endurance","author":"lee","year":"0","journal-title":"Proc IEEE Int Electron Device Meeting"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2433536"},{"key":"ref16","article-title":"Spice model of memristor with nonlinear dopant drift","volume":"18","author":"biolek","year":"2009","journal-title":"Radioengineering"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2016.2570248"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2014.7050047"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2017.8227863"},{"key":"ref4","article-title":"Design implications of memristor-based RRAM cross-point structures","author":"xu","year":"0","journal-title":"Proc Design Automation and Test Europe"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICM.2017.8268885"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2357292"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2282132"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/nl901874j"},{"key":"ref7","article-title":"MRL—memristor ratioed logic","author":"kvatinsky","year":"0","journal-title":"Proc Int Workshop Cell Nanoscale Netw Their Appl"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1038\/nature06932","article-title":"The missing memristor found","volume":"453","author":"strukov","year":"2008","journal-title":"Nature"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1971.1083337"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2016.7843030"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2763171"}],"event":{"name":"2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","start":{"date-parts":[[2019,11,27]]},"location":"Genoa, Italy","end":{"date-parts":[[2019,11,29]]}},"container-title":["2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8955687\/8964633\/08964702.pdf?arnumber=8964702","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T18:35:09Z","timestamp":1755714909000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8964702\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/icecs46596.2019.8964702","relation":{},"subject":[],"published":{"date-parts":[[2019,11]]}}}