{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,2]],"date-time":"2025-09-02T00:03:53Z","timestamp":1756771433083,"version":"3.44.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/icecs46596.2019.8965155","type":"proceedings-article","created":{"date-parts":[[2020,1,23]],"date-time":"2020-01-23T22:15:31Z","timestamp":1579817731000},"page":"791-794","source":"Crossref","is-referenced-by-count":2,"title":["Adoption of 2T2C ferroelectric memory cells for logic operation"],"prefix":"10.1109","author":[{"given":"Taras","family":"Ravsher","sequence":"first","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]},{"given":"Halid","family":"Mulaosmanovic","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]},{"given":"Evelyn T.","family":"Breyer","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]},{"given":"Viktor","family":"Havel","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]},{"given":"Thomas","family":"Mikolajick","sequence":"additional","affiliation":[{"name":"Chair for Nanoelectronic Materials Technische Universit&#x00E4;t Dresden,Dresden,Germany"}]},{"given":"Stefan","family":"Slesazeck","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]}],"member":"263","reference":[{"key":"ref4","first-page":"595","article-title":"Flexible ferroelectric-capacitor element for low power and compact logic-in-memory architectures","volume":"20","author":"ishihara","year":"2013","journal-title":"J Mult Log Soft Comput"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351408"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2018.2885932"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2019.8739742"},{"key":"ref11","first-page":"142","article-title":"Ferroelectric Tunnel Junctions based on Ferroelectric-Dielectric Hf0.5Zr0.5.O2\/A12O3Capacitor Stacks","author":"max","year":"0","journal-title":"European Solid-State Device Research Conference (ESSDERC)"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"91301","DOI":"10.1143\/APEX.1.091301","article-title":"Fabrication of a nonvolatile full adder based on logic-in-memory architecture using magnetic tunnel junctions","volume":"1","author":"matsunaga","year":"2008","journal-title":"Appl Phys Express"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2282132"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838397"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342213"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2011.213"},{"key":"ref1","first-page":"25","article-title":"Ferroelectricity in HfO2 enables nonvolatile data storage in 28 nm HKMG","author":"muller","year":"0","journal-title":"2012 Symposium on VLSI Technology (VLSIT)"}],"event":{"name":"2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","start":{"date-parts":[[2019,11,27]]},"location":"Genoa, Italy","end":{"date-parts":[[2019,11,29]]}},"container-title":["2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8955687\/8964633\/08965155.pdf?arnumber=8965155","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:22:04Z","timestamp":1756754524000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8965155\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icecs46596.2019.8965155","relation":{},"subject":[],"published":{"date-parts":[[2019,11]]}}}