{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T19:01:41Z","timestamp":1754161301618,"version":"3.41.2"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/icecs46596.2019.8965167","type":"proceedings-article","created":{"date-parts":[[2020,1,23]],"date-time":"2020-01-23T22:15:31Z","timestamp":1579817731000},"page":"586-589","source":"Crossref","is-referenced-by-count":3,"title":["A Statistical Timing Model for CMOS Inverter in Near-threshold Region Considering Input Transition Time"],"prefix":"10.1109","author":[{"given":"Peng","family":"Cao","sequence":"first","affiliation":[{"name":"National ASIC System Engineering Research Center, Southeast University,Nanjing,China"}]},{"given":"Zhiyuan","family":"Liu","sequence":"additional","affiliation":[{"name":"National ASIC System Engineering Research Center, Southeast University,Nanjing,China"}]},{"given":"Bingqian","family":"Xu","sequence":"additional","affiliation":[{"name":"National ASIC System Engineering Research Center, Southeast University,Nanjing,China"}]},{"given":"Jingjing","family":"Guo","sequence":"additional","affiliation":[{"name":"National ASIC System Engineering Research Center, Southeast University,Nanjing,China"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/81.883331"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LPE.2005.195479"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2009.2017645"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2014.6783332"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2282316"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/SLIP.2017.7974912"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865419"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2285691"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2015.7058986"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2012.2184377"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228572"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2015.2418151"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2511148"}],"event":{"name":"2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","start":{"date-parts":[[2019,11,27]]},"location":"Genoa, Italy","end":{"date-parts":[[2019,11,29]]}},"container-title":["2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8955687\/8964633\/08965167.pdf?arnumber=8965167","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,28]],"date-time":"2025-07-28T19:39:29Z","timestamp":1753731569000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8965167\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/icecs46596.2019.8965167","relation":{},"subject":[],"published":{"date-parts":[[2019,11]]}}}