{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T00:18:19Z","timestamp":1725754699068},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,11,28]],"date-time":"2021-11-28T00:00:00Z","timestamp":1638057600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,11,28]],"date-time":"2021-11-28T00:00:00Z","timestamp":1638057600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,11,28]],"date-time":"2021-11-28T00:00:00Z","timestamp":1638057600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,11,28]]},"DOI":"10.1109\/icecs53924.2021.9665508","type":"proceedings-article","created":{"date-parts":[[2022,1,10]],"date-time":"2022-01-10T21:09:19Z","timestamp":1641848959000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production"],"prefix":"10.1109","author":[{"given":"Gaku","family":"Ogihara","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takayuki","family":"Nakatani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daisuke","family":"Iimori","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shogo","family":"Katayama","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anna","family":"Kuwana","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Keno","family":"Sato","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takashi","family":"Ishida","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toshiyuki","family":"Okamoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tamotsu","family":"Ichikawa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yujie","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jianglin","family":"Wei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kazumi","family":"Hatayama","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haruo","family":"Kobayashi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in $\\mu\\mathrm{V}$ - order by DC-AC Conversion","author":"sasaki","year":"2019","journal-title":"IEEE 3rd International Test Conference in Asia"},{"journal-title":"An Introduction to Mixed-Signal IC Test & Measurement","year":"2012","author":"robert","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS49688.2020.9301558"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS49688.2020.9301550"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/FBIE.2009.5405833"},{"key":"ref1","article-title":"A High Precision Pico-Amperes Scale Current Measurement in Radiation Detection","author":"yarlagadda","year":"2012","journal-title":"Applied Mechanics and Materials"}],"event":{"name":"2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","start":{"date-parts":[[2021,11,28]]},"location":"Dubai, United Arab Emirates","end":{"date-parts":[[2021,12,1]]}},"container-title":["2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9665417\/9665446\/09665508.pdf?arnumber=9665508","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:56:54Z","timestamp":1652201814000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9665508\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,11,28]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/icecs53924.2021.9665508","relation":{},"subject":[],"published":{"date-parts":[[2021,11,28]]}}}