{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:49:56Z","timestamp":1740102596846,"version":"3.37.3"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,12,4]],"date-time":"2023-12-04T00:00:00Z","timestamp":1701648000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,4]],"date-time":"2023-12-04T00:00:00Z","timestamp":1701648000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100009950","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100009950","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,12,4]]},"DOI":"10.1109\/icecs58634.2023.10382795","type":"proceedings-article","created":{"date-parts":[[2024,1,10]],"date-time":"2024-01-10T19:38:25Z","timestamp":1704915505000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Nanoscale Mem-Devices for Chemical Sensing"],"prefix":"10.1109","author":[{"given":"Bergoi","family":"Ibarlucea","sequence":"first","affiliation":[{"name":"Institute for Materials Science and Nanotechnology, Max Bergmann Center for Biomaterials, TUD Dresden University of Technology,Dresden,Germany"}]},{"given":"Ert\u00fcrk Enver","family":"Yildirim","sequence":"additional","affiliation":[{"name":"Institute for Materials Science and Nanotechnology, Max Bergmann Center for Biomaterials, TUD Dresden University of Technology,Dresden,Germany"}]},{"given":"Ronald","family":"Tetzlaff","sequence":"additional","affiliation":[{"name":"TUD Dresden University of Technology,Chair of Fundamentals of Electrical Engineering,Dresden,Germany"}]},{"given":"Alon","family":"Ascoli","sequence":"additional","affiliation":[{"name":"TUD Dresden University of Technology,Chair of Fundamentals of Electrical Engineering,Dresden,Germany"}]},{"given":"Luis-Antonio","family":"Panes-Ruiz","sequence":"additional","affiliation":[{"name":"Institute for Materials Science and Nanotechnology, Max Bergmann Center for Biomaterials, TUD Dresden University of Technology,Dresden,Germany"}]},{"given":"Gianaurelio","family":"Cuniberti","sequence":"additional","affiliation":[{"name":"Institute for Materials Science and Nanotechnology, Max Bergmann Center for Biomaterials, TUD Dresden University of Technology,Dresden,Germany"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1038\/s41467-019-08642-y"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1038\/nmat4756"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1038\/s41928-020-0412-1"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1038\/s41598-020-71962-3"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.snb.2012.04.089"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1021\/acs.nanolett.6b01648"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1007\/s12274-017-1720-2"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/ICECS46596.2019.8964926"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1002\/anie.201916595"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1039\/c7lc00807d"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TCSI.2023.3339240"},{"key":"ref12","article-title":"Edge of Chaos Theory Sheds Light into the All-or-None Phenomenon in Neurons-Part II: On the Necessary and Sufficient Conditions for the Observation of the Entire Life Cycle of an Action Potential","author":"Ascoli","year":"2023","journal-title":"IEEE TCAS-I"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1007\/s12274-021-3771-7"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1557\/s43577-023-00613-5"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TCSI.2019.2940909"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TCSI.2019.2957813"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/TCSI.2020.2978460"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1016\/j.biosx.2019.100016"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1039\/d0tc04843g"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1016\/j.snb.2021.130419"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1039\/c8mh01577e"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1021\/acsami.1c23390"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1038\/s41563-020-0703-y"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1080\/14686996.2022.2152290"}],"event":{"name":"2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","start":{"date-parts":[[2023,12,4]]},"location":"Istanbul, Turkiye","end":{"date-parts":[[2023,12,7]]}},"container-title":["2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10382705\/10382711\/10382795.pdf?arnumber=10382795","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,13]],"date-time":"2024-01-13T18:24:58Z","timestamp":1705170298000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10382795\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,4]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/icecs58634.2023.10382795","relation":{},"subject":[],"published":{"date-parts":[[2023,12,4]]}}}