{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,8]],"date-time":"2024-11-08T05:27:44Z","timestamp":1731043664763,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,12,4]],"date-time":"2023-12-04T00:00:00Z","timestamp":1701648000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,4]],"date-time":"2023-12-04T00:00:00Z","timestamp":1701648000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,12,4]]},"DOI":"10.1109\/icecs58634.2023.10382845","type":"proceedings-article","created":{"date-parts":[[2024,1,10]],"date-time":"2024-01-10T19:38:25Z","timestamp":1704915505000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A Tool for Automatic Radiation-Hardened SRAM Layout Generation"],"prefix":"10.1109","author":[{"given":"Leonardo H.","family":"Brendler","sequence":"first","affiliation":[{"name":"IMS - Laboratoire de l’Intégration du Matériau au Système - UMR 5218 - Université de Bordeaux"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Herv\u00e9","family":"Lapuyade","sequence":"additional","affiliation":[{"name":"IMS - Laboratoire de l’Intégration du Matériau au Système - UMR 5218 - Université de Bordeaux"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yann","family":"Deval","sequence":"additional","affiliation":[{"name":"IMS - Laboratoire de l’Intégration du Matériau au Système - UMR 5218 - Université de Bordeaux"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ricardo","family":"Reis","sequence":"additional","affiliation":[{"name":"Instituto de Informática, PGMICRO - Universidade Federal do Rio Grande do Sul"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fran\u00e7ois","family":"Rivet","sequence":"additional","affiliation":[{"name":"IMS - Laboratoire de l’Intégration du Matériau au Système - UMR 5218 - Université de Bordeaux"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-04660-6_1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2033796"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3099202"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-31069-5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2875051"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2022.3151977"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2020.3002654"},{"key":"ref8","doi-asserted-by":"crossref","DOI":"10.1109\/RADECS55911.2022.10412382","article-title":"An sram-based multiple event upsets detection method for space applications","volume-title":"2022 22th European Conference on Radiation and Its Effects on Components and Systems (RADECS). IEEE","author":"Brendler"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2002.1175845"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3310876"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.05.009"},{"article-title":"Study and development of low power consumption srams on 28 nm fd-soi cmos process","year":"2017","author":"Olivera Mederos","key":"ref12"}],"event":{"name":"2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","start":{"date-parts":[[2023,12,4]]},"location":"Istanbul, Turkiye","end":{"date-parts":[[2023,12,7]]}},"container-title":["2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10382705\/10382711\/10382845.pdf?arnumber=10382845","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,7]],"date-time":"2024-11-07T21:23:10Z","timestamp":1731014590000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10382845\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,4]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/icecs58634.2023.10382845","relation":{},"subject":[],"published":{"date-parts":[[2023,12,4]]}}}