{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,11]],"date-time":"2026-02-11T01:03:32Z","timestamp":1770771812045,"version":"3.50.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,11,17]],"date-time":"2025-11-17T00:00:00Z","timestamp":1763337600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,17]],"date-time":"2025-11-17T00:00:00Z","timestamp":1763337600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,11,17]]},"DOI":"10.1109\/icecs66544.2025.11270580","type":"proceedings-article","created":{"date-parts":[[2025,12,9]],"date-time":"2025-12-09T18:31:34Z","timestamp":1765305094000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A 208 MS\/s 32-Channel Burst-Sampling ADC in 0.18um BiCMOS"],"prefix":"10.1109","author":[{"given":"Kenny T.","family":"Vohl","sequence":"first","affiliation":[{"name":"Integrated Analog Circuits and RF Systems RWTH Aachen University,Aachen,Germany,D-52074"}]},{"given":"Tobias","family":"Zekorn","sequence":"additional","affiliation":[{"name":"Integrated Analog Circuits and RF Systems RWTH Aachen University,Aachen,Germany,D-52074"}]},{"given":"Erik","family":"Wehr","sequence":"additional","affiliation":[{"name":"Integrated Analog Circuits and RF Systems RWTH Aachen University,Aachen,Germany,D-52074"}]},{"given":"Ralf","family":"Wunderlich","sequence":"additional","affiliation":[{"name":"Integrated Analog Circuits and RF Systems RWTH Aachen University,Aachen,Germany,D-52074"}]},{"given":"Stefan","family":"Heinen","sequence":"additional","affiliation":[{"name":"Integrated Analog Circuits and RF Systems RWTH Aachen University,Aachen,Germany,D-52074"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/apec48139.2024.10509371"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/epe23ecceeurope58414.2023.10264429"},{"key":"ref3","first-page":"20","article-title":"Gate driver integrated closed-loop control for electromagnetic emissions and switching losses of wide bandgap power electronic converters","volume-title":"Dissertation, Rheinisch-Westfalische Technische Hochschule\u00a8 Aachen, Aachen","author":"Henn","year":"2023"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2007.378257"},{"key":"ref5","article-title":"Adc performance survey 1997-2024","author":"Murmann"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2013.2258814"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2003.1234315"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc.2003.1257116"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2004.1332692"}],"event":{"name":"2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)","location":"Marrakech, Morocco","start":{"date-parts":[[2025,11,17]]},"end":{"date-parts":[[2025,11,19]]}},"container-title":["2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11270487\/11270494\/11270580.pdf?arnumber=11270580","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T20:58:49Z","timestamp":1770757129000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11270580\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11,17]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/icecs66544.2025.11270580","relation":{},"subject":[],"published":{"date-parts":[[2025,11,17]]}}}