{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,11]],"date-time":"2026-02-11T00:26:07Z","timestamp":1770769567696,"version":"3.50.0"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,11,17]],"date-time":"2025-11-17T00:00:00Z","timestamp":1763337600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,17]],"date-time":"2025-11-17T00:00:00Z","timestamp":1763337600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004721","name":"University of Tokyo","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004721","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100014424","name":"Meiji University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100014424","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,11,17]]},"DOI":"10.1109\/icecs66544.2025.11270597","type":"proceedings-article","created":{"date-parts":[[2025,12,9]],"date-time":"2025-12-09T18:31:34Z","timestamp":1765305094000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Enhanced Voltage Reference Circuit Design Using Quadratic Function Modeling of MOSFET Characteristics in the Saturation Region"],"prefix":"10.1109","author":[{"given":"Shuya","family":"Isawa","sequence":"first","affiliation":[{"name":"Meiji University,Kawasaki,Japan"}]},{"given":"Kawori","family":"Sekine","sequence":"additional","affiliation":[{"name":"Meiji University,Kawasaki,Japan"}]},{"given":"Kazuyuki","family":"Wada","sequence":"additional","affiliation":[{"name":"Meiji University,Kawasaki,Japan"}]},{"given":"Fran\u00e7ois","family":"Rivet","sequence":"additional","affiliation":[{"name":"University of Bordeaux,Talence,France"}]},{"given":"Herv\u00e9","family":"Lapuyade","sequence":"additional","affiliation":[{"name":"University of Bordeaux,Talence,France"}]},{"given":"Yann","family":"Deval","sequence":"additional","affiliation":[{"name":"University of Bordeaux,Talence,France"}]}],"member":"263","reference":[{"issue":"9","key":"ref1","first-page":"582","article-title":"A Resistor less CMOS Voltage Reference Based on Mutual Compensation of VT and VTH","volume":"60","author":"Zhou","year":"2013","journal-title":"IEEE Trans. Circuits Syst. II, EXPRESS BRIEFS"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/81.933328"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2012.2195065"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2022.3231216"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2927240"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1541\/ieejeiss.129.1499"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS61496.2024.10848948"},{"key":"ref8","article-title":"Proposal and Application of Equivalent MOSFET with different temperature coefficient of threshold voltage","volume-title":"2023 International Conference on Analog VLSI Circuits(AVIC)","author":"Kobyahasi"},{"key":"ref9","article-title":"Design and measurement of voltage reference circuit by an equivalent MOSFET having different temperature coefficient of threshold voltage","volume-title":"2025 International Conference on Analog VLSI Circuits(AVIC)","author":"Isawa"},{"key":"ref10","article-title":"PTAT voltage generater based voltage reference circuit without external bias voltage","volume-title":"2025 International Conference on Analog VLSI Circuits(AVIC)","author":"Murata"}],"event":{"name":"2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)","location":"Marrakech, Morocco","start":{"date-parts":[[2025,11,17]]},"end":{"date-parts":[[2025,11,19]]}},"container-title":["2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11270487\/11270494\/11270597.pdf?arnumber=11270597","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T20:59:17Z","timestamp":1770757157000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11270597\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11,17]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/icecs66544.2025.11270597","relation":{},"subject":[],"published":{"date-parts":[[2025,11,17]]}}}