{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T16:29:12Z","timestamp":1781281752409,"version":"3.54.1"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,11,17]],"date-time":"2025-11-17T00:00:00Z","timestamp":1763337600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,17]],"date-time":"2025-11-17T00:00:00Z","timestamp":1763337600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,11,17]]},"DOI":"10.1109\/icecs66544.2025.11270704","type":"proceedings-article","created":{"date-parts":[[2025,12,9]],"date-time":"2025-12-09T18:31:34Z","timestamp":1765305094000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Polysilicon PIN diode characterization and scaling in low-cost 40nm technology for IoT applications"],"prefix":"10.1109","author":[{"given":"Wiame El","family":"Khayyari","sequence":"first","affiliation":[{"name":"STMicroelectronics Rousset,ZI de Peynier,Rousset,France,13790"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Noemie","family":"Couzi","sequence":"additional","affiliation":[{"name":"STMicroelectronics Rousset,ZI de Peynier,Rousset,France,13790"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jeremy","family":"Postel-Pellerin","sequence":"additional","affiliation":[{"name":"Aix-Marseille University, Toulon University,CNRS, IM2NP,Marseille Cedex 20,France,13451"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hassen","family":"Aziza","sequence":"additional","affiliation":[{"name":"Aix-Marseille University, Toulon University,CNRS, IM2NP,Marseille Cedex 20,France,13451"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Abderrezak","family":"Marzaki","sequence":"additional","affiliation":[{"name":"STMicroelectronics Rousset,ZI de Peynier,Rousset,France,13790"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Fran\u00e7ois","family":"Courbin","sequence":"additional","affiliation":[{"name":"STMicroelectronics Rousset,ZI de Peynier,Rousset,France,13790"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alexandre","family":"Malherbe","sequence":"additional","affiliation":[{"name":"STMicroelectronics Rousset,ZI de Peynier,Rousset,France,13790"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Arnaud","family":"Regnier","sequence":"additional","affiliation":[{"name":"STMicroelectronics Rousset,ZI de Peynier,Rousset,France,13790"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Stephan","family":"Niel","sequence":"additional","affiliation":[{"name":"STMicroelectronics Crolles,Crolles,France,38920"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3000587"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2956403"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EOSESD.2007.4401747"},{"key":"ref4","article-title":"Latch-Up","author":"Johnson","year":"2015","journal-title":"Texas Instruments, White paper, SCAA124"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ULIS.2008.4527172"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2022.108575"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2021.114265"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DTTIS62212.2024.10780257"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW56459.2022.10032763"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS202256217.2022.9970962"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISIEA.2010.5679427"},{"issue":"6","key":"ref12","first-page":"1","article-title":"Comparative study of IV- characteristics of pin diode at different doping concentrations for different semiconductor materials using TCAD","volume":"4","author":"Saha","year":"2015","journal-title":"International Journal of Electronics and Communication Engineering (IJECE)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/cds2.12120"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2016.0359"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICISET54810.2022.9775924"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2014.6911007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DTTIS62212.2024.10780382"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2016.7495294"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS53253.2021.9505093"}],"event":{"name":"2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)","location":"Marrakech, Morocco","start":{"date-parts":[[2025,11,17]]},"end":{"date-parts":[[2025,11,19]]}},"container-title":["2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11270487\/11270494\/11270704.pdf?arnumber=11270704","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T20:58:42Z","timestamp":1770757122000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11270704\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11,17]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/icecs66544.2025.11270704","relation":{},"subject":[],"published":{"date-parts":[[2025,11,17]]}}}