{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T22:35:49Z","timestamp":1729636549028,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,9]]},"DOI":"10.1109\/iceee.2012.6421151","type":"proceedings-article","created":{"date-parts":[[2013,1,31]],"date-time":"2013-01-31T12:28:30Z","timestamp":1359635310000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Extraction noise transport time (τ) and its impact over the four noise parameters of advanced SiGe HBT"],"prefix":"10.1109","author":[{"given":"L. F.","family":"Luis-Pineda","sequence":"first","affiliation":[]},{"given":"E.","family":"Ramirez-Garcia","sequence":"additional","affiliation":[]},{"given":"N.","family":"Zerounian","sequence":"additional","affiliation":[]},{"given":"F.","family":"Aniel","sequence":"additional","affiliation":[]},{"given":"M. A. Enciso","family":"Aguilar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/55.585350"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/22.348087"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDER.2005.1546602"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(77)90183-6"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2009.01.019"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/22.981270"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JRPROC.1958.286873"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/27\/6\/065016"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.828277"},{"key":"10","first-page":"957","article-title":"A straightforward noise de-embedding method and its application to high-speed silicon bipolar transistors","author":"aufinger","year":"1995","journal-title":"Proceedings of the 27th European Solid-State Device Research Conference ESSDERC"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852846"},{"key":"6","first-page":"226","article-title":"Modeling and extraction of SiGe HBT noise parameters from measured y parameters and accounting for noise correlation","author":"yau","year":"0","journal-title":"Proc Silicon Monolithic Integrated Circuits in RF Systems"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/16.381984"},{"key":"4","doi-asserted-by":"crossref","first-page":"2568","DOI":"10.1109\/16.960384","article-title":"A unified approach to RF and microwave noise parameter modeling in bipolar transistors","volume":"48","author":"niu","year":"2001","journal-title":"IEEE Trans on Elec Dev"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1049\/el:19981130"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2011.03.006"}],"event":{"name":"2012 9th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE 2012)","start":{"date-parts":[[2012,9,26]]},"location":"Mexico City, Mexico","end":{"date-parts":[[2012,9,28]]}},"container-title":["2012 9th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6414582\/6421106\/06421151.pdf?arnumber=6421151","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T02:46:22Z","timestamp":1498013182000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6421151\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,9]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/iceee.2012.6421151","relation":{},"subject":[],"published":{"date-parts":[[2012,9]]}}}