{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T18:49:21Z","timestamp":1725475761941},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/iceee.2015.7357998","type":"proceedings-article","created":{"date-parts":[[2015,12,17]],"date-time":"2015-12-17T17:00:07Z","timestamp":1450371607000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Experimental system for induction motor fault diagnosis: FFT and AR model schemes evaluation"],"prefix":"10.1109","author":[{"given":"F. M.","family":"Garcia-Guevara","sequence":"first","affiliation":[]},{"given":"F. J.","family":"Villalobos-Pina","sequence":"additional","affiliation":[]},{"given":"J. A.","family":"Morones-Alba","sequence":"additional","affiliation":[]},{"given":"R.","family":"Alvarez-Salas","sequence":"additional","affiliation":[]},{"given":"F.","family":"Pazos-Flores","sequence":"additional","affiliation":[]},{"given":"J. A.","family":"Alvarez-Salas","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MIA.2007.909802"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2011.2128310"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2007.10.008"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICQR2MSE.2012.6246310"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLC.2007.4370300"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCCNT.2013.6726528"},{"key":"ref16","article-title":"Monitoreo y diagnóstico automático de fallas en sistemas dinámicos","author":"verde","year":"2013","journal-title":"Trillas Mexico"},{"key":"ref17","first-page":"17","article-title":"Calibrating Standards of Mutual Inductance","author":"jaroslav","year":"2005","journal-title":"Instrumentation and Measurement Tecnology Conference (IMTC)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.809069"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/382043.382304"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/2943.930988"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2005.847955"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2355816"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2003.811741"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2013.02.016"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2230598"},{"journal-title":"Electric Machines CRC Press","year":"2013","author":"toliyat","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/9781118601662"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2090839"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.909076"}],"event":{"name":"2015 12th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","start":{"date-parts":[[2015,10,28]]},"location":"Mexico City, Mexico","end":{"date-parts":[[2015,10,30]]}},"container-title":["2015 12th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7347854\/7357811\/07357998.pdf?arnumber=7357998","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T21:24:52Z","timestamp":1490390692000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7357998\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iceee.2015.7357998","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}