{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:16:52Z","timestamp":1740100612301,"version":"3.37.3"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,2,6]],"date-time":"2022-02-06T00:00:00Z","timestamp":1644105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,2,6]],"date-time":"2022-02-06T00:00:00Z","timestamp":1644105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100010418","name":"IITP","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100010418","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100014188","name":"MSIT","doi-asserted-by":"publisher","award":["2017-0-00830"],"award-info":[{"award-number":["2017-0-00830"]}],"id":[{"id":"10.13039\/501100014188","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,2,6]]},"DOI":"10.1109\/iceic54506.2022.9748845","type":"proceedings-article","created":{"date-parts":[[2022,4,11]],"date-time":"2022-04-11T21:19:21Z","timestamp":1649711961000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Studying the near-room temperature insulator-to-metal switching in ultrathin VO2 films on (001) TiO2"],"prefix":"10.1109","author":[{"given":"Tetiana","family":"Slusar","sequence":"first","affiliation":[{"name":"Electronics and Telecommunications Research Institute,Semiconductor Materials Components Equipment Technology Center,Daejeon,Republic of Korea"}]},{"given":"Bitna","family":"Kim","sequence":"additional","affiliation":[{"name":"Electronics and Telecommunications Research Institute,Semiconductor Materials Components Equipment Technology Center,Daejeon,Republic of Korea"}]},{"given":"Tae Moon","family":"Roh","sequence":"additional","affiliation":[{"name":"Electronics and Telecommunications Research Institute,Semiconductor Materials Components Equipment Technology Center,Daejeon,Republic of Korea"}]},{"given":"Hyun-Tak","family":"Kim","sequence":"additional","affiliation":[{"name":"Electronics and Telecommunications Research Institute,Semiconductor Materials Components Equipment Technology Center,Daejeon,Republic of Korea"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/nano11020338"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.matlet.2011.10.075"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2019.107729"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.1446215"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.87.115121"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1039\/c2cp42763j"},{"key":"ref16","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevB.85.094305","article-title":"Phonon anharmonicity of rutile TiO2 studied by Raman spectrometry and molecular dynamics simulations","volume":"85","author":"lan","year":"2012","journal-title":"Phys Rev B"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1038\/srep23119"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.materresbull.2018.02.030"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cap.2021.05.010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0953-8984\/28\/8\/085602"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/acsaelm.0c00983"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1126\/science.aam9189"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.2431456"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.72.3389"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevB.91.245155","article-title":"Phase transition in bulk single crystals and thin films of VO2 by nanoscale infrared spectroscopy and imaging","volume":"91","author":"liu","year":"2015","journal-title":"Phys Rev B"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.3.34"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IMWS-AMP.2019.8880086"}],"event":{"name":"2022 International Conference on Electronics, Information, and Communication (ICEIC)","start":{"date-parts":[[2022,2,6]]},"location":"Jeju, Korea, Republic of","end":{"date-parts":[[2022,2,9]]}},"container-title":["2022 International Conference on Electronics, Information, and Communication (ICEIC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9748174\/9748152\/09748845.pdf?arnumber=9748845","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,14]],"date-time":"2022-06-14T20:43:45Z","timestamp":1655239425000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9748845\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,2,6]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iceic54506.2022.9748845","relation":{},"subject":[],"published":{"date-parts":[[2022,2,6]]}}}