{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T17:30:53Z","timestamp":1755797453127,"version":"3.44.0"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,1,19]],"date-time":"2025-01-19T00:00:00Z","timestamp":1737244800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,19]],"date-time":"2025-01-19T00:00:00Z","timestamp":1737244800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,1,19]]},"DOI":"10.1109\/iceic64972.2025.10879677","type":"proceedings-article","created":{"date-parts":[[2025,2,18]],"date-time":"2025-02-18T13:17:22Z","timestamp":1739884642000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Semi-supervised Learning for Photovoltaic Cell Defect Detection Using Module and Cell-Level Labels"],"prefix":"10.1109","author":[{"given":"Nayoung","family":"Gil","sequence":"first","affiliation":[{"name":"Hanyang University,Department of Applied Artificial Intelligence,Ansan,Republic of Korea"}]},{"given":"Kyungri","family":"Park","sequence":"additional","affiliation":[{"name":"Hanyang University,Department of Applied Artificial Intelligence,Ansan,Republic of Korea"}]},{"given":"Daeyun","family":"Jeong","sequence":"additional","affiliation":[{"name":"Hanyang University,Department of Intelligence and Information Engineering,Ansan,Republic of Korea"}]},{"given":"Woohwan","family":"Jung","sequence":"additional","affiliation":[{"name":"Hanyang University,Department of Applied Artificial Intelligence,Ansan,Republic of Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3349975"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2022.06.031"},{"key":"ref3","first-page":"974","article-title":"Automatic defect classification of electroluminescence images of photovoltaic modules based on deep learning CNN","volume":"6","author":"Verma","year":"2022","journal-title":"Int. J. Mech. Eng."},{"key":"ref4","article-title":"Attention-based deep multiple instance learning","volume-title":"Proc. Int. Conf. Mach. Learn. (ICML)","author":"Ilse","year":"2018"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/EUSIPCO.2018.8553025"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2019.2920732"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00065"},{"key":"ref8","first-page":"910","article-title":"Cell-level defect detection using module-level labels in solar photovoltaic electroluminescence image","volume-title":"Proc. Korea Software Congress","author":"Gil","year":"2023"}],"event":{"name":"2025 International Conference on Electronics, Information, and Communication (ICEIC)","start":{"date-parts":[[2025,1,19]]},"location":"Osaka, Japan","end":{"date-parts":[[2025,1,22]]}},"container-title":["2025 International Conference on Electronics, Information, and Communication (ICEIC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10879455\/10879601\/10879677.pdf?arnumber=10879677","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,18]],"date-time":"2025-08-18T19:36:08Z","timestamp":1755545768000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10879677\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1,19]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/iceic64972.2025.10879677","relation":{},"subject":[],"published":{"date-parts":[[2025,1,19]]}}}