{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T13:24:11Z","timestamp":1725715451901},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,5]]},"DOI":"10.1109\/icicdt.2012.6232860","type":"proceedings-article","created":{"date-parts":[[2012,7,19]],"date-time":"2012-07-19T19:42:57Z","timestamp":1342726977000},"page":"1-4","source":"Crossref","is-referenced-by-count":6,"title":["A 0.32V, 55fJ per bit access energy, CMOS 65nm bit-interleaved SRAM with radiation Soft Error tolerance"],"prefix":"10.1109","author":[{"given":"Sylvain","family":"Clerc","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fady","family":"Abouzeid","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gilles","family":"Gasiot","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Gauthier","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dimitri","family":"Soussan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Philippe","family":"Roche","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2010.5510284"},{"journal-title":"Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices","year":"2006","key":"15"},{"key":"16","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4419-6993-4","author":"nicolaidis","year":"2011","journal-title":"Soft Errors on Modern Electronics Systems"},{"year":"0","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2011.6044936"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/1393921.1393954"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2010818"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488826"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1977.1050882"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2002.808156"},{"journal-title":"Subthreshold Architecture and Digital Circuits Study in Submicronic Cmos Technology","year":"2010","author":"abouzeid","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391498"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2011.5937503"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2100834"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373427"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052809"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2008.4523220"}],"event":{"name":"2012 IEEE International Conference on IC Design & Technology (ICICDT)","start":{"date-parts":[[2012,5,30]]},"location":"Austin, TX, USA","end":{"date-parts":[[2012,6,1]]}},"container-title":["2012 IEEE International Conference on IC Design & Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6225515\/6232832\/06232860.pdf?arnumber=6232860","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T17:37:51Z","timestamp":1497980271000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6232860\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/icicdt.2012.6232860","relation":{},"subject":[],"published":{"date-parts":[[2012,5]]}}}