{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T04:47:29Z","timestamp":1754110049986},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,5]]},"DOI":"10.1109\/icicdt.2012.6232876","type":"proceedings-article","created":{"date-parts":[[2012,7,19]],"date-time":"2012-07-19T19:42:57Z","timestamp":1342726977000},"page":"1-4","source":"Crossref","is-referenced-by-count":4,"title":["On-chip MOS PVT variation monitor for slew rate self-adjusting 2×VDD output buffers"],"prefix":"10.1109","author":[{"family":"Chih-Lin Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Hsin-Yuan Tseng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ron-Chi","family":"Kuo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chua-Chin","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.810030"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373467"},{"key":"1","first-page":"599","article-title":"Short-channel effects and device models","author":"razavi","year":"2001","journal-title":"Design of Analog CMOS Integrated Circuits"},{"key":"7","first-page":"293","article-title":"A highspeed memory interface circuit tolerant to PVT variations and channel noise","author":"park","year":"2001","journal-title":"Proc European Solid-State Circuits Conf"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ASQED.2009.5206272"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2008.4675036"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.813253"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2050941"}],"event":{"name":"2012 IEEE International Conference on IC Design & Technology (ICICDT)","start":{"date-parts":[[2012,5,30]]},"location":"Austin, TX, USA","end":{"date-parts":[[2012,6,1]]}},"container-title":["2012 IEEE International Conference on IC Design & Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6225515\/6232832\/06232876.pdf?arnumber=6232876","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T11:41:12Z","timestamp":1490096472000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6232876\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/icicdt.2012.6232876","relation":{},"subject":[],"published":{"date-parts":[[2012,5]]}}}