{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T09:04:21Z","timestamp":1725527061012},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/icicdt.2013.6563296","type":"proceedings-article","created":{"date-parts":[[2013,8,14]],"date-time":"2013-08-14T12:20:40Z","timestamp":1376482840000},"page":"29-32","source":"Crossref","is-referenced-by-count":0,"title":["Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models"],"prefix":"10.1109","author":[{"given":"Plamen","family":"Asenov","sequence":"first","affiliation":[]},{"given":"David","family":"New","sequence":"additional","affiliation":[]},{"given":"Dave","family":"Reid","sequence":"additional","affiliation":[]},{"given":"Campbell","family":"Millar","sequence":"additional","affiliation":[]},{"given":"Scott","family":"Roy","sequence":"additional","affiliation":[]},{"given":"Asen","family":"Asenov","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"13","first-page":"347","article-title":"Variability in sub-100nm SRAM designs","author":"herald","year":"2004","journal-title":"Proc Int Conf Comput -Aided Des"},{"key":"11","first-page":"86","author":"asenov","year":"0","journal-title":"Simulation of Statistical Variability in Nano MOSFETs in 2007 Symposium on VLSI Technology"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.53"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDER.2006.307735"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.813457"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/16.915703"},{"year":"0","key":"10"},{"key":"7","first-page":"163","article-title":"A general approach for multivariate statistical MOSFET compact modeling preserving correlations","author":"sohrmann","year":"0","journal-title":"Proc ESSDERC 2011"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2011.6035024"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.873215"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.909792"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2010.5556223"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6606-3"}],"event":{"name":"2013 International Conference on IC Design & Technology (ICICDT)","start":{"date-parts":[[2013,5,29]]},"location":"Pavia, Italy","end":{"date-parts":[[2013,5,31]]}},"container-title":["Proceedings of 2013 International Conference on IC Design & Technology (ICICDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6556112\/6563281\/06563296.pdf?arnumber=6563296","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T17:16:41Z","timestamp":1490203001000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6563296\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/icicdt.2013.6563296","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}