{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:57:39Z","timestamp":1759147059345},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/icicdt.2013.6563299","type":"proceedings-article","created":{"date-parts":[[2013,8,14]],"date-time":"2013-08-14T16:20:40Z","timestamp":1376497240000},"page":"41-44","source":"Crossref","is-referenced-by-count":3,"title":["Evaluating analog circuit performance in light of MOSFET aging at different time scales"],"prefix":"10.1109","author":[{"given":"Husni","family":"Habal","sequence":"first","affiliation":[]},{"given":"Helmut","family":"Graeb","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910130"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/MIEL.2012.6222864"},{"journal-title":"Virtuoso Relxpert Reliability Simulator User Guide Product Version 7 0 1","year":"2008","key":"10"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763239"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2011.2135470"},{"journal-title":"Predictive Technology Model (PTM)","year":"0","author":"cao","key":"6"},{"key":"5","article-title":"Analysis of aging mitigation techniques for digital circuits considering recovery effects","author":"barke","year":"2013","journal-title":"EDA Workshop"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456958"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/43.256927"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241795"},{"journal-title":"Eldo UDRM User's Manual","year":"2009","key":"11"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2062870"}],"event":{"name":"2013 International Conference on IC Design & Technology (ICICDT)","start":{"date-parts":[[2013,5,29]]},"location":"Pavia, Italy","end":{"date-parts":[[2013,5,31]]}},"container-title":["Proceedings of 2013 International Conference on IC Design & Technology (ICICDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6556112\/6563281\/06563299.pdf?arnumber=6563299","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T21:12:11Z","timestamp":1490217131000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6563299\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/icicdt.2013.6563299","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}