{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T05:51:34Z","timestamp":1729662694791,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/icicdt.2013.6563335","type":"proceedings-article","created":{"date-parts":[[2013,8,14]],"date-time":"2013-08-14T12:20:40Z","timestamp":1376482840000},"page":"195-198","source":"Crossref","is-referenced-by-count":0,"title":["Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits"],"prefix":"10.1109","author":[{"given":"Masamichi","family":"Suzuki","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Atsuhiro","family":"Kinoshita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuichiro","family":"Mitani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"ITRS 2011 Edition","year":"0","key":"3"},{"key":"2","doi-asserted-by":"crossref","first-page":"734","DOI":"10.1109\/JSSC.2003.810049","volume":"38","author":"hyde","year":"2003","journal-title":"IEEE J Solid-State Circuits"},{"key":"1","doi-asserted-by":"crossref","first-page":"1569","DOI":"10.1109\/4.44992","volume":"24","author":"carley","year":"1989","journal-title":"IEEE J Solid-State Circuits"},{"key":"7","doi-asserted-by":"crossref","first-page":"329","DOI":"10.1016\/j.mee.2005.04.086","volume":"80","author":"yi","year":"2005","journal-title":"Microelectronic Engineering"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/16.106238"},{"key":"5","first-page":"71","author":"mori","year":"1986","journal-title":"VLSI Symp Dig Tech Papers"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/16.69905"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2008.04.016"}],"event":{"name":"2013 International Conference on IC Design & Technology (ICICDT)","start":{"date-parts":[[2013,5,29]]},"location":"Pavia, Italy","end":{"date-parts":[[2013,5,31]]}},"container-title":["Proceedings of 2013 International Conference on IC Design & Technology (ICICDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6556112\/6563281\/06563335.pdf?arnumber=6563335","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T13:50:29Z","timestamp":1498053029000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6563335\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/icicdt.2013.6563335","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}