{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T03:52:55Z","timestamp":1725508375304},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/icicdt.2014.6838603","type":"proceedings-article","created":{"date-parts":[[2014,7,28]],"date-time":"2014-07-28T19:03:50Z","timestamp":1406574230000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Robust bias temperature instability refresh design and methodology for memory cell recovery"],"prefix":"10.1109","author":[{"given":"Gerard","family":"Touma","sequence":"first","affiliation":[]},{"given":"Rouwaida","family":"Kanj","sequence":"additional","affiliation":[]},{"given":"Rajiv","family":"Joshi","sequence":"additional","affiliation":[]},{"given":"Ayman","family":"Kayssi","sequence":"additional","affiliation":[]},{"given":"Ali","family":"Chehab","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","first-page":"1370","author":"mukhopadhyay","year":"2007","journal-title":"IEEE JSSCC"},{"journal-title":"Predictive Technology Mode","year":"0","key":"16"},{"key":"13","first-page":"358","author":"kang","year":"2007","journal-title":"IEEE Design Automation Conference"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.896317"},{"journal-title":"IEEE IRPS","year":"2011","author":"bansale","key":"11"},{"key":"12","first-page":"163","author":"kim","year":"2008","journal-title":"IEEE ICICDT"},{"key":"3","first-page":"41","author":"pelella","year":"2008","journal-title":"IEEE SOI conference"},{"key":"2","first-page":"211","author":"joshi","year":"2006","journal-title":"IEEE SOI Conf"},{"key":"1","doi-asserted-by":"crossref","first-page":"36","DOI":"10.1109\/MDT.2010.95","author":"joshi","year":"2010","journal-title":"IEEE Design & Test of Computers"},{"key":"10","first-page":"26","author":"kaczer","year":"2010","journal-title":"IEEE IRPS"},{"key":"7","first-page":"20","author":"kaczer","year":"2008","journal-title":"IEEE IRPS"},{"key":"6","first-page":"354","author":"ceratti","year":"2012","journal-title":"IEEE 15th International Symposium on (DDECS)"},{"key":"5","first-page":"1","author":"cabe","year":"2009","journal-title":"IEEE ISQED"},{"key":"4","doi-asserted-by":"crossref","first-page":"849","DOI":"10.1145\/1837274.1837486","author":"qi","year":"2010","journal-title":"IEEE 47th Design Automation Conference (DAC)"},{"key":"9","first-page":"212","author":"kim","year":"2006","journal-title":"IEEE 7th ISQED"},{"key":"8","first-page":"148","author":"reddy","year":"2004","journal-title":"IEEE International Test Conference"}],"event":{"name":"2014 IEEE International Conference on IC Design & Technology (ICICDT)","start":{"date-parts":[[2014,5,28]]},"location":"Austin, TX, USA","end":{"date-parts":[[2014,5,30]]}},"container-title":["2014 IEEE International Conference on IC Design & Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6832295\/6838579\/06838603.pdf?arnumber=6838603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T17:25:57Z","timestamp":1498152357000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6838603\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/icicdt.2014.6838603","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}