{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T14:40:57Z","timestamp":1725720057999},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1109\/icicdt.2018.8399784","type":"proceedings-article","created":{"date-parts":[[2018,7,2]],"date-time":"2018-07-02T21:15:04Z","timestamp":1530566104000},"page":"173-176","source":"Crossref","is-referenced-by-count":0,"title":["Electrical characterization of process induced effects on non-silicon devices"],"prefix":"10.1109","author":[{"given":"Chadwin D.","family":"Young","sequence":"first","affiliation":[]},{"given":"Pavel","family":"Bolshakov","sequence":"additional","affiliation":[]},{"given":"Rodolfo A.","family":"Rodriguez-Davila","sequence":"additional","affiliation":[]},{"given":"Peng","family":"Zhao","sequence":"additional","affiliation":[]},{"given":"Ava","family":"Khosravi","sequence":"additional","affiliation":[]},{"given":"Israel","family":"Mejia","sequence":"additional","affiliation":[]},{"given":"Manuel","family":"Quevedo-Lopez","sequence":"additional","affiliation":[]},{"given":"Christopher L.","family":"Hinkle","sequence":"additional","affiliation":[]},{"given":"Robert M.","family":"Wallace","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2018 International Conference on IC Design & Technology (ICICDT)","start":{"date-parts":[[2018,6,4]]},"location":"Otranto","end":{"date-parts":[[2018,6,6]]}},"container-title":["2018 International Conference on IC Design & Technology (ICICDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8391403\/8399713\/08399784.pdf?arnumber=8399784","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,7,23]],"date-time":"2018-07-23T18:55:17Z","timestamp":1532372117000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8399784\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/icicdt.2018.8399784","relation":{},"subject":[],"published":{"date-parts":[[2018,6]]}}}