{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T23:27:41Z","timestamp":1730244461796,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/icicdt.2019.8790845","type":"proceedings-article","created":{"date-parts":[[2019,8,8]],"date-time":"2019-08-08T19:25:46Z","timestamp":1565292346000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["DNFIT Based Curve Fitting And Prediction In Semiconductor Modeling And Simulation"],"prefix":"10.1109","author":[{"given":"WenFei","family":"Hu","sequence":"first","affiliation":[]},{"given":"Dongsheng","family":"Ma","sequence":"additional","affiliation":[]},{"given":"Miao","family":"li","sequence":"additional","affiliation":[]},{"given":"Zhijian","family":"Pan","sequence":"additional","affiliation":[]},{"given":"Zuochang","family":"Ye","sequence":"additional","affiliation":[]},{"given":"Yan","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","first-page":"436","DOI":"10.1038\/nature14539","article-title":"Deep learning.[J]","volume":"521","author":"lecun","year":"2015","journal-title":"Nature"},{"key":"ref3","article-title":"The elements of statistical learning","volume":"1","author":"friedman","year":"2001","journal-title":"Springer series in statistics"},{"key":"ref10","article-title":"Time Series Analysis, Forecasting and Control[J]","volume":"134","author":"box","year":"1971","journal-title":"Journal of the American Statistical Association"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-017-0984-9"},{"key":"ref11","article-title":"Carbon nanotube network film-based ring oscillators with sub 10-ns propagation time and their applications in radio-frequency signal transmission[J]","author":"yang","year":"2017","journal-title":"Nano Research"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2009.09.027"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/61.772353"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1963.1105517"},{"journal-title":"BSIM3v3 2 MOSFET Model Users Manual","year":"0","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2307\/2683591"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"718","DOI":"10.1109\/IEDM.1987.191531","article-title":"the impact of gate-induced drain leakage current on mosfet scaling","author":"chan","year":"1987","journal-title":"1987 International Electron Devices Meeting"}],"event":{"name":"2019 International Conference on IC Design and Technology (ICICDT)","start":{"date-parts":[[2019,6,17]]},"location":"SUZHOU, China","end":{"date-parts":[[2019,6,19]]}},"container-title":["2019 International Conference on IC Design and Technology (ICICDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8784132\/8790825\/08790845.pdf?arnumber=8790845","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T11:10:18Z","timestamp":1658142618000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8790845\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icicdt.2019.8790845","relation":{},"subject":[],"published":{"date-parts":[[2019,6]]}}}