{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T14:51:59Z","timestamp":1754146319357,"version":"3.41.2"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,23]],"date-time":"2025-06-23T00:00:00Z","timestamp":1750636800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,23]],"date-time":"2025-06-23T00:00:00Z","timestamp":1750636800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,23]]},"DOI":"10.1109\/icicdt65192.2025.11078127","type":"proceedings-article","created":{"date-parts":[[2025,7,17]],"date-time":"2025-07-17T17:54:49Z","timestamp":1752774889000},"page":"41-44","source":"Crossref","is-referenced-by-count":0,"title":["Dual-Mode PUF and TRNG Design with Ring Generator on 180nm CMOS"],"prefix":"10.1109","author":[{"given":"Tuan-Kiet","family":"Dang","sequence":"first","affiliation":[{"name":"The University of Electro-Communications (UEC),Tokyo,Japan,182-8585"}]},{"given":"Khai-Duy","family":"Nguyen","sequence":"additional","affiliation":[{"name":"The University of Electro-Communications (UEC),Tokyo,Japan,182-8585"}]},{"given":"Trong-Thuc","family":"Hoang","sequence":"additional","affiliation":[{"name":"The University of Electro-Communications (UEC),Tokyo,Japan,182-8585"}]},{"given":"Cong-Kha","family":"Pham","sequence":"additional","affiliation":[{"name":"The University of Electro-Communications (UEC),Tokyo,Japan,182-8585"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3199218"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3156788"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2010.334"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1023\/A:1027422805851"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197633"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3304901"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3316890"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3011648"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3125255"}],"event":{"name":"2025 International Conference on IC Design and Technology (ICICDT)","location":"Lecce, Italy","start":{"date-parts":[[2025,6,23]]},"end":{"date-parts":[[2025,6,25]]}},"container-title":["2025 International Conference on IC Design and Technology (ICICDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11078014\/11077980\/11078127.pdf?arnumber=11078127","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T04:43:33Z","timestamp":1752813813000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11078127\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,23]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/icicdt65192.2025.11078127","relation":{},"subject":[],"published":{"date-parts":[[2025,6,23]]}}}