{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T00:00:50Z","timestamp":1730246450673,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,12]]},"DOI":"10.1109\/iciinfs.2008.4798350","type":"proceedings-article","created":{"date-parts":[[2009,3,9]],"date-time":"2009-03-09T22:57:43Z","timestamp":1236639463000},"page":"1-6","source":"Crossref","is-referenced-by-count":10,"title":["Assessment of Financial Losses due to Voltage Sags in an Indian Distribution System"],"prefix":"10.1109","author":[{"given":"A. K.","family":"Goswami","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C. P.","family":"Gupta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G. K.","family":"Singh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.860266"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.870988"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.870987"},{"year":"0","key":"15"},{"journal-title":"SEMI F47-0200 Specification for Semiconductor Processing Equipment Voltage Sag Immunity","year":"1999","key":"16"},{"volume":"1159","journal-title":"IEEE Standard","year":"1995","key":"13"},{"year":"0","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEXCON.1997.598525"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.824396"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/28.216550"},{"year":"0","key":"20"},{"key":"2","article-title":"understanding power quality problems: voltage sags and interruptions","author":"math","year":"2000","journal-title":"IEE Power Engineering Series"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1016\/S0142-0615(03)00063-2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.832353(410) 2"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1049\/ip-gtd:20020008"},{"year":"0","key":"6"},{"year":"0","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/39.981334"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.837828(410) 2"},{"key":"8","article-title":"voltage sag effects on continuous industrial processes: desensitizing study for textile manufacture","author":"caldon","year":"1992","journal-title":"Proc of second Int Conf on power quality End-use applications and perspectives"}],"event":{"name":"2008 IEEE Region 10 and the Third international Conference on Industrial and Information Systems (ICIIS)","start":{"date-parts":[[2008,12,8]]},"location":"Kharagpur, India","end":{"date-parts":[[2008,12,10]]}},"container-title":["2008 IEEE Region 10 and the Third international Conference on Industrial and Information Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4796894\/4798312\/04798350.pdf?arnumber=4798350","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T18:21:18Z","timestamp":1489774878000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4798350\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,12]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iciinfs.2008.4798350","relation":{},"subject":[],"published":{"date-parts":[[2008,12]]}}}