{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,20]],"date-time":"2025-09-20T19:15:44Z","timestamp":1758395744046,"version":"3.44.0"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,12]]},"DOI":"10.1109\/iciinfs.2016.8262999","type":"proceedings-article","created":{"date-parts":[[2018,1,23]],"date-time":"2018-01-23T12:20:02Z","timestamp":1516710002000},"page":"540-545","source":"Crossref","is-referenced-by-count":6,"title":["Ensemble methods for the prediction of number of faults: A study on eclipse project"],"prefix":"10.1109","author":[{"given":"Santosh Singh","family":"Rathore","sequence":"first","affiliation":[{"name":"Dept. of Computer Engineering and Engineering, Indian Institute of Technology Roorkee"}]},{"given":"Sandeep","family":"Kumar","sequence":"additional","affiliation":[{"name":"Dept. of Computer Engineering and Engineering, Indian Institute of Technology Roorkee"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/32.859533"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/INMIC.2008.4777762"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TR.2007.896761"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1145\/1013886.1007524"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/TSE.2005.49"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1145\/1146238.1146246"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TR.2007.896757"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/j.procs.2015.08.454"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1007\/3-540-45014-9_1"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1007\/978-3-642-12127-2_5"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.neunet.2014.09.003"},{"key":"ref27","first-page":"343","article-title":"Learning with continuous classes","volume":"92","author":"quinlan","year":"0"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/S0020-7373(87)80053-6"},{"key":"ref6","first-page":"125","article-title":"Support vector clustering","volume":"2","author":"ben-hur","year":"2002","journal-title":"The Journal of Machine Learning Research"},{"key":"ref5","first-page":"41","article-title":"An empirical study of the naive bayes classifier","volume":"3","author":"rish","year":"0"},{"key":"ref8","first-page":"4241","article-title":"Software defect prediction based on classifiers ensemble","volume":"8","author":"wang","year":"2011","journal-title":"Information and Computer Science"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/CIDM.2009.4938648"},{"key":"ref2","first-page":"1","article-title":"A decision tree logic based recommendation system to select software fault prediction techniques","author":"rathore","year":"2016","journal-title":"Computing"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1007\/s00500-014-1576-2"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1007\/s10515-010-0069-5"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1007\/BF00058655"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"832","DOI":"10.1109\/34.709601","article-title":"The random subspace method for constructing decisionforests","volume":"20","author":"ho","year":"1998","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/B978-1-55860-146-8.50019-9"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1016\/S0893-6080(05)80023-1"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/TPAMI.2006.211"},{"key":"ref26","doi-asserted-by":"crossref","DOI":"10.4324\/9780203774441","author":"cohen","year":"2013","journal-title":"Applied Multiple Regression\/Correlation Analysis for the Behavioral Sciences"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1007\/s00500-016-2284-x"}],"event":{"name":"2016 11th International Conference on Industrial and Information Systems (ICIIS)","start":{"date-parts":[[2016,12,3]]},"location":"Roorkee, India","end":{"date-parts":[[2016,12,4]]}},"container-title":["2016 11th International Conference on Industrial and Information Systems (ICIIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8253767\/8262887\/08262999.pdf?arnumber=8262999","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,14]],"date-time":"2025-08-14T18:46:24Z","timestamp":1755197184000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8262999\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,12]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/iciinfs.2016.8262999","relation":{},"subject":[],"published":{"date-parts":[[2016,12]]}}}