{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T16:10:44Z","timestamp":1729613444822,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icip.2002.1038915","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T19:34:26Z","timestamp":1056569666000},"page":"III-105-III-108","source":"Crossref","is-referenced-by-count":2,"title":["Texture analysis using fractals for tool wear monitoring"],"prefix":"10.1109","volume":"1","author":[{"given":"A.A.","family":"Kassim","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Zhu Mian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.A.","family":"Mannan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0043-1648(99)00128-3"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/5.18626"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.1991.150631"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"3887","DOI":"10.1109\/ICASSP.2000.860252","article-title":"Hidden Markov models for monitoring machining tool-wear","volume":"6","author":"les","year":"2000","journal-title":"Acoustics Speech and Signal Processing ICASSP'00 Proceedings 2000 IEEE International Conference on"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0890-6955(00)00112-7"},{"journal-title":"Fractal Geometry in Digital Imaging","year":"1998","author":"turner","key":"ref4"},{"journal-title":"The Fractal Geometry of Nature","year":"1983","author":"mandelbrot","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7552(98)00211-6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/34.368149"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4899-2578-7"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/APCC.1999.820396"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-8655(00)00050-7"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0890-6955(99)00122-4"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0043-1648(99)00327-0"}],"event":{"name":"IEEE International Geoscience and Remote Sensing Symposium. IGARSS 2002","acronym":"ICIP-02","location":"Toronto, Ont., Canada"},"container-title":["Proceedings. International Conference on Image Processing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8052\/22267\/01038915.pdf?arnumber=1038915","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T18:43:43Z","timestamp":1497552223000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1038915\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/icip.2002.1038915","relation":{},"subject":[]}}