{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,3]],"date-time":"2026-04-03T15:30:00Z","timestamp":1775230200395,"version":"3.50.1"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icip.2002.1038978","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T23:34:26Z","timestamp":1056584066000},"page":"III-353-III-356","source":"Crossref","is-referenced-by-count":13,"title":["Texture inspection for defects using neural networks and support vector machines"],"prefix":"10.1109","volume":"1","author":[{"given":"A.","family":"Kumar","sequence":"first","affiliation":[]},{"given":"H.C.","family":"Shen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1983.4767446"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/34.85670"},{"key":"ref10","author":"bishop","year":"1995","journal-title":"Neural Networks for Pattern Recognition"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"298","DOI":"10.1117\/12.196112","article-title":"Morphological image processing for the recognition of surface defects","volume":"2249","author":"muller","year":"1994","journal-title":"Proc SPIE"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/72.329697"},{"key":"ref5","first-page":"1950","article-title":"Automated visual inspection of metallic surfaces","author":"ercil","year":"1994","journal-title":"Proc 3rdInti Conf On Automation Robotics and Computer Vision (ICARCV'94)"},{"key":"ref12","author":"cristianini","year":"2001","journal-title":"An Introduction to Support Vector Machines"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/34.481543"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1117\/12.271250"},{"key":"ref2","author":"kumar","year":"2001","journal-title":"Automated defect detection in textured materials"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"610","DOI":"10.1109\/TSMC.1973.4309314","article-title":"Textural features for image classification","volume":"3","author":"rarlick","year":"1973","journal-title":"IEEE Trans Syst Man Cybern"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1117\/1.600814"}],"event":{"name":"IEEE International Geoscience and Remote Sensing Symposium. IGARSS 2002","location":"Toronto, Ont., Canada","acronym":"ICIP-02"},"container-title":["Proceedings. International Conference on Image Processing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8052\/22267\/01038978.pdf?arnumber=1038978","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T22:43:51Z","timestamp":1497566631000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1038978\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/icip.2002.1038978","relation":{},"subject":[]}}