{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T14:16:09Z","timestamp":1761488169374},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008]]},"DOI":"10.1109\/icip.2008.4711776","type":"proceedings-article","created":{"date-parts":[[2008,12,17]],"date-time":"2008-12-17T20:54:55Z","timestamp":1229547295000},"page":"401-404","source":"Crossref","is-referenced-by-count":37,"title":["An improved perception-based no-reference objective image sharpness metric using iterative edge refinement"],"prefix":"10.1109","author":[{"given":"Srenivas","family":"Varadarajan","sequence":"first","affiliation":[]},{"given":"Lina J.","family":"Karam","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Statistics","year":"1997","author":"freedman","key":"13"},{"key":"11","doi-asserted-by":"crossref","DOI":"10.1109\/ROBOT.2001.933045","article-title":"practical issues in pixel-based autofocusing for machine vision","author":"chern","year":"2001","journal-title":"Proceedings of the 2001 IEEE international Conference on Robotics and Automation"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.1999.822923"},{"year":"0","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2007.4379342"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1016\/j.image.2003.08.003"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1016\/j.image.2003.08.002"},{"article-title":"autofocusing and astigmatism correction in the scanning electron microscope","year":"2000","author":"batten","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-2818.1982.tb00412.x"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2006.888087"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/34.689301"},{"key":"9","first-page":"4730","article-title":"a kurtosis-based statistitcal measure for two-dimensional processes and its application to image sharpness","author":"zhang","year":"2003","journal-title":"Proceedings of Section of Physical and Engineering Sciences of American Statistical Society"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1002\/cyto.990120302"}],"event":{"name":"2008 15th IEEE International Conference on Image Processing","start":{"date-parts":[[2008,10,12]]},"location":"San Diego, CA, USA","end":{"date-parts":[[2008,10,15]]}},"container-title":["2008 15th IEEE International Conference on Image Processing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4667700\/4711669\/04711776.pdf?arnumber=4711776","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T14:53:31Z","timestamp":1497797611000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4711776\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/icip.2008.4711776","relation":{},"subject":[],"published":{"date-parts":[[2008]]}}}