{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T10:43:57Z","timestamp":1761561837997,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/icip.2013.6738087","type":"proceedings-article","created":{"date-parts":[[2014,2,13]],"date-time":"2014-02-13T17:44:44Z","timestamp":1392313484000},"page":"423-426","source":"Crossref","is-referenced-by-count":12,"title":["A novel SVD-based image quality assessment metric"],"prefix":"10.1109","author":[{"given":"Shuigen","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chenwei","family":"Deng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weisi","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Baojun","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jie","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","first-page":"99","article-title":"Mean squared error:Love it or leave it","volume":"26","author":"wang","year":"2009","journal-title":"IEEE Signal Processing Magazine"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2012.2219544"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2011.2175935"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2005.859378"},{"key":"2","first-page":"1398","article-title":"Multi-scale struc-tural similarity for image quality assessment","author":"wang","year":"2003","journal-title":"Proc IEEE Asi-lomar Conf Signals Syst Comput"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2011.2163391"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2011.2109730"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2010.5649265"},{"key":"5","first-page":"1","article-title":"Most apparent distortion:Full-reference image quality assessment and the role of strat-egy","volume":"19","author":"larson","year":"2010","journal-title":"Journal of Electronic Imaging"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.901820"},{"key":"9","first-page":"30","article-title":"Tid2008-A database for evaluation of full-reference visual quality assessment metrics","volume":"10","author":"ponomarenko","year":"2009","journal-title":"Adv Modern Ra-dioelectron"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2011.2169971"}],"event":{"name":"2013 20th IEEE International Conference on Image Processing (ICIP)","start":{"date-parts":[[2013,9,15]]},"location":"Melbourne, Australia","end":{"date-parts":[[2013,9,18]]}},"container-title":["2013 IEEE International Conference on Image Processing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6726158\/6737993\/06738087.pdf?arnumber=6738087","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T13:18:05Z","timestamp":1490275085000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6738087\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/icip.2013.6738087","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}