{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T13:32:36Z","timestamp":1725715956566},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,10]]},"DOI":"10.1109\/icip.2014.7025155","type":"proceedings-article","created":{"date-parts":[[2015,2,5]],"date-time":"2015-02-05T12:41:49Z","timestamp":1423140109000},"page":"773-777","source":"Crossref","is-referenced-by-count":11,"title":["Implementation of automatic crack evaluation using Crack Fundamental Element"],"prefix":"10.1109","author":[{"given":"Yichang James","family":"Tsai","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chenglong","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhaohua","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/BEC.2010.5630750"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1117\/12.876724"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/11795131_100"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3141\/1940-11"},{"key":"ref8","article-title":"Development of a New 3D Transverse Laser Profiling System for the Automatic Measurement of Road Cracks","author":"laurent","year":"2008","journal-title":"6th Symposium on Pavement Surface Characteristics SURF"},{"key":"ref7","article-title":"A multi-scale crack fundamental element model for real-world pavement crack classification","author":"tsai","year":"2012","journal-title":"Journal of Computing in Civil Engineering"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-8667.2004.00341.x"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0887-3801(1999)13:4(270)"}],"event":{"name":"2014 IEEE International Conference on Image Processing (ICIP)","start":{"date-parts":[[2014,10,27]]},"location":"Paris, France","end":{"date-parts":[[2014,10,30]]}},"container-title":["2014 IEEE International Conference on Image Processing (ICIP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6992914\/7024995\/07025155.pdf?arnumber=7025155","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T02:00:19Z","timestamp":1490320819000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7025155\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/icip.2014.7025155","relation":{},"subject":[],"published":{"date-parts":[[2014,10]]}}}