{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T19:50:53Z","timestamp":1729626653737,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/icip.2017.8296320","type":"proceedings-article","created":{"date-parts":[[2018,2,22]],"date-time":"2018-02-22T22:03:23Z","timestamp":1519337003000},"page":"445-449","source":"Crossref","is-referenced-by-count":8,"title":["Reflectance-based surface saliency"],"prefix":"10.1109","author":[{"given":"Gilles","family":"Pitard","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gaetan","family":"Le Goic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alamin","family":"Mansouri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hugues","family":"Favreliere","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maurice","family":"Pillet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sony","family":"George","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jon Yngve","family":"Hardeberg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"547","article-title":"Bayesian surprise attracts human attention","author":"itti","year":"2005","journal-title":"Neural Information Processing Systems"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jas.2010.03.009"},{"journal-title":"Surface appearance metrology and modeling for industrial quality inspection","year":"2016","author":"pitard","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2011.5944296"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206558"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"86","DOI":"10.1109\/TPAMI.2013.110","article-title":"Discriminative Illumination: Per-Pixel Classification of Raw Materials Based on Optimal Projections of Spectral BRDF","volume":"36","author":"liu","year":"2014","journal-title":"Pattern Analysis and Machine Intelligence IEEE Transactions on"},{"key":"ref16","article-title":"On the generalized distance in statistics","author":"mahalanobis","year":"1936","journal-title":"Proceedings of the National Institute of Sciences (Calcutta)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2013.03.001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1038\/nrn1114"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0042-6989(99)00163-7"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1186\/1687-5281-2014-25"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2012.02.012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1111\/cgf.12867"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"952523","DOI":"10.1117\/12.2184840","article-title":"Discrete Modal Decomposition for surface appearance modelling and rendering","volume":"9525","author":"pitard","year":"2015","journal-title":"Proc SPIE Optical Metrology"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1023\/A:1011126920638"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(99)00003-7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/383259.383320"},{"key":"ref9","first-page":"848","article-title":"Combining gradient and albedo data for rotation invariant classification of 3D surface texture","volume":"2","author":"wu","year":"2003","journal-title":"International Conference on Computer Vision ICCV 2003"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.6028\/NBS.MONO.160"},{"journal-title":"Saliency Toolbox 2 3","year":"2006","author":"walther","key":"ref20"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/1073204.1073244"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1117\/12.512618"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.visres.2008.06.019"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2013.2257989"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1167\/9.4.11"}],"event":{"name":"2017 IEEE International Conference on Image Processing (ICIP)","start":{"date-parts":[[2017,9,17]]},"location":"Beijing","end":{"date-parts":[[2017,9,20]]}},"container-title":["2017 IEEE International Conference on Image Processing (ICIP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8267582\/8296222\/08296320.pdf?arnumber=8296320","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,11]],"date-time":"2019-10-11T13:44:01Z","timestamp":1570801441000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8296320\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/icip.2017.8296320","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}