{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,6]],"date-time":"2026-06-06T04:08:52Z","timestamp":1780718932642,"version":"3.54.1"},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/icip.2018.8451736","type":"proceedings-article","created":{"date-parts":[[2018,9,7]],"date-time":"2018-09-07T17:59:22Z","timestamp":1536343162000},"page":"3818-3822","source":"Crossref","is-referenced-by-count":17,"title":["Semi-Blind Spatially-Variant Deconvolution in Optical Microscopy with Local Point Spread Function Estimation by Use of Convolutional Neural Networks"],"prefix":"10.1109","author":[{"given":"Adrian","family":"Shajkofci","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Michael","family":"Liebling","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2013.6738290"},{"key":"ref11","first-page":"1097","article-title":"ImageNet classification with deep Convolutional Neural Networks","author":"krizhevsky","year":"2012","journal-title":"Advances in Neural Information Processing Systems 25"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.81"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref14","first-page":"436","volume":"521","author":"lecun","year":"2015","journal-title":"Deep Learning"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298677"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.35"},{"key":"ref17","first-page":"689","volume":"1","author":"von zernike","year":"1934","journal-title":"Beugungstheorie des schneidenver-fahrens und seiner verbesserten form der phasenkontrastmethode"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref19","author":"jia","year":"2014","journal-title":"Caffe Convolutional Architecture for Fast Feature Embedding"},{"key":"ref4","first-page":"43","article-title":"Comparison of deconvolution software in 3D microscopy: A user point of view-part 1","volume":"12","author":"griffa","year":"2010","journal-title":"Journal of GIT Imaging & Microscopy"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.10.000561"},{"key":"ref3","first-page":"28","volume":"115","author":"sage","year":"2017","journal-title":"DeconvolutionLab2 An open-source software for deconvolution microscopy"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.34"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2010.5540158"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.1109011108"},{"key":"ref5","first-page":"1075","article-title":"A “Learn 2D, Apply 3D” method for 3D deconvolution microscopy","author":"soulez","year":"2014","journal-title":"IEEE IS'2014"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.12.000058"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2011.148"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.6.001357"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2008.924393"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/jemt.20294"},{"key":"ref20","first-page":"55","volume":"62","author":"richardson","year":"1972","journal-title":"Bayesian-Based Iterative Method of Image Restoration"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISBI.2011.5872549"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-015-0817-x"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"59","DOI":"10.1007\/978-3-642-40246-3_8","article-title":"Blind deconvolution using alternating maximum a posteriori estimation with heavy-tailed priors","author":"kotera","year":"2013","journal-title":"International Conference on Computer Analysis of Images and Patterns"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-5348-6_24"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-014-0727-3"}],"event":{"name":"2018 25th IEEE International Conference on Image Processing (ICIP)","location":"Athens","start":{"date-parts":[[2018,10,7]]},"end":{"date-parts":[[2018,10,10]]}},"container-title":["2018 25th IEEE International Conference on Image Processing (ICIP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8436606\/8451009\/08451736.pdf?arnumber=8451736","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T09:17:58Z","timestamp":1643188678000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8451736\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/icip.2018.8451736","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}