{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T18:44:53Z","timestamp":1772477093354,"version":"3.50.1"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,8]],"date-time":"2023-10-08T00:00:00Z","timestamp":1696723200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,8]],"date-time":"2023-10-08T00:00:00Z","timestamp":1696723200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100016818","name":"UT-Battelle","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100016818","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100000958","name":"Office of Energy","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000958","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100006116","name":"Advanced Manufacturing Office","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006116","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,8]]},"DOI":"10.1109\/icip49359.2023.10223192","type":"proceedings-article","created":{"date-parts":[[2023,9,11]],"date-time":"2023-09-11T17:58:31Z","timestamp":1694455111000},"page":"2990-2994","source":"Crossref","is-referenced-by-count":4,"title":["Deep Learning Based Workflow for Accelerated Industrial X-Ray Computed Tomography"],"prefix":"10.1109","author":[{"given":"Obaidullah","family":"Rahman","sequence":"first","affiliation":[{"name":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"}]},{"given":"Singanallur V.","family":"Venkatakrishnan","sequence":"additional","affiliation":[{"name":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"}]},{"given":"Luke","family":"Scime","sequence":"additional","affiliation":[{"name":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"}]},{"given":"Paul","family":"Brackman","sequence":"additional","affiliation":[{"name":"Carl Zeiss Industrial Metrology, LLC,Maple Grove,MN,USA,55369"}]},{"given":"Curtis","family":"Frederick","sequence":"additional","affiliation":[{"name":"Carl Zeiss Industrial Metrology, LLC,Maple Grove,MN,USA,55369"}]},{"given":"Ryan","family":"Dehoff","sequence":"additional","affiliation":[{"name":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"}]},{"given":"Vincent","family":"Paquit","sequence":"additional","affiliation":[{"name":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"}]},{"given":"Amirkoushyar","family":"Ziabari","sequence":"additional","affiliation":[{"name":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s11665-021-05919-6"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.mattod.2021.03.020"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.1.000612"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/s41524-023-01032-5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1115\/IMECE2020-23766"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP46576.2022.9898017"},{"key":"ref7","first-page":"160","article-title":"High Throughput Deep Learning-Based X-ray CT Characterization for Process Optimization in Metal Additive Manufacturing","volume":"77","author":"Ziabari","year":"2022","journal-title":"ASPE and euspen Summer Topical Meeting"},{"key":"ref8","article-title":"Robust and interpretable blind image denoising via bias-free convolutional neural networks","volume-title":"International Conference on Learning Representations (ICLR)","author":"Mohan"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2018.8645364"},{"key":"ref10","first-page":"19","article-title":"MBIR Training for a 2.5D DL network in X-ray CT","volume-title":"16th International Meeting on Fully 3D Image Reconstruction in Radiology and Nuclear Medicine","author":"Rahman"},{"key":"ref11","article-title":"Neural Network-based Single-material Beam Hardening Correction for X-ray CT in Additive Manufacturing","volume-title":"(to appear) 17th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine","author":"Rahman"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0031-9155\/47\/23\/305"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1979.4310076"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2022.103298"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"}],"event":{"name":"2023 IEEE International Conference on Image Processing (ICIP)","location":"Kuala Lumpur, Malaysia","start":{"date-parts":[[2023,10,8]]},"end":{"date-parts":[[2023,10,11]]}},"container-title":["2023 IEEE International Conference on Image Processing (ICIP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10221937\/10221892\/10223192.pdf?arnumber=10223192","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T20:56:41Z","timestamp":1709326601000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10223192\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,8]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/icip49359.2023.10223192","relation":{},"subject":[],"published":{"date-parts":[[2023,10,8]]}}}