{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T12:20:40Z","timestamp":1766578840600,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,23]],"date-time":"2023-09-23T00:00:00Z","timestamp":1695427200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,23]],"date-time":"2023-09-23T00:00:00Z","timestamp":1695427200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,23]]},"DOI":"10.1109\/iciscae59047.2023.10393710","type":"proceedings-article","created":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T18:32:54Z","timestamp":1705948374000},"page":"1144-1149","source":"Crossref","is-referenced-by-count":1,"title":["Research on time parameter measurement technology of digital integrated circuit based on FPGA"],"prefix":"10.1109","author":[{"given":"Yuyu","family":"Sun","sequence":"first","affiliation":[{"name":"Jiangsu Automation Research Institute,Test Center,Lianyungang,China"}]},{"given":"Han","family":"Wu","sequence":"additional","affiliation":[{"name":"Jiangsu Automation Research Institute,Test Center,Lianyungang,China"}]},{"given":"Ding","family":"Yao","sequence":"additional","affiliation":[{"name":"Jiangsu Automation Research Institute,Test Center,Lianyungang,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/19.650787"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2009.2028748"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/92.920830"},{"issue":"6","key":"ref4","first-page":"13","article-title":"SRAM FPGA fault test based on BIST","volume":"32","author":"Yang","year":"2021","journal-title":"Measurement and Control Technology"},{"issue":"7","key":"ref5","first-page":"59","article-title":"Research on FPGA programmable resource testing technology","author":"Zhang","year":"2018","journal-title":"Electronic Components and Information Technology"},{"issue":"5","key":"ref6","first-page":"36","article-title":"Research on testing technology based on SRAM FPGA","volume":"30","author":"Sun","year":"2021","journal-title":"Foreign Electronic Measurement Technology"},{"issue":"12","key":"ref7","first-page":"17","article-title":"FPGA testing based on ATE","author":"Xie","year":"2019","journal-title":"Electronics and Packaging"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/12.729796"},{"issue":"12","key":"ref9","first-page":"257","article-title":"Suspended substrate stripline filters for ESM applications, Communications, Radar and Signal Proceeding","volume":"32","author":"Dean","year":"2018","journal-title":"IEEE Proceedings"},{"issue":"3","key":"ref10","first-page":"39","article-title":"A new filter test for assessing crossflow membrane filtration","author":"Kupetz","year":"2021","journal-title":"Brauwelt international"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.4236\/ijg.2021.1211055"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1982.1131258"},{"issue":"54","key":"ref13","first-page":"43","article-title":"Design and fabrication of Ku-band Schottky diode power detecto","volume":"32","author":"Ji","year":"2008","journal-title":"Science and Technology of West China"},{"issue":"29","key":"ref14","first-page":"77","article-title":"Application of Monte Carlo method in Uncertainty analysis of microwave power measurement","author":"Cui","year":"2008","journal-title":"Acta Metrologica Sinica"}],"event":{"name":"2023 IEEE 6th International Conference on Information Systems and Computer Aided Education (ICISCAE)","start":{"date-parts":[[2023,9,23]]},"location":"Dalian, China","end":{"date-parts":[[2023,9,25]]}},"container-title":["2023 IEEE 6th International Conference on Information Systems and Computer Aided Education (ICISCAE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10391857\/10391858\/10393710.pdf?arnumber=10393710","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:25:44Z","timestamp":1706754344000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10393710\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,23]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iciscae59047.2023.10393710","relation":{},"subject":[],"published":{"date-parts":[[2023,9,23]]}}}