{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T19:18:49Z","timestamp":1725563929554},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/icit.2016.7474721","type":"proceedings-article","created":{"date-parts":[[2016,6,23]],"date-time":"2016-06-23T12:36:46Z","timestamp":1466685406000},"page":"30-35","source":"Crossref","is-referenced-by-count":0,"title":["A V-model framework for the certification against the Annex R of IEC 60335-1: Class B appliances"],"prefix":"10.1109","author":[{"given":"Supachai","family":"Vorapojpisut","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Atmel Application Note AVR998","article-title":"Guide to IEC60730 Class B compliance with AVR microcontrollers","year":"2008","key":"ref10"},{"journal-title":"Guidelines for meeting IEC 60730 Class B requirements with FM3 MCUs — self-test library implementations","year":"2011","key":"ref11"},{"journal-title":"STMicroelectronics Application Note AN3307","article-title":"Guidelines for obtaining IEC 60335 Class B certification for any STM32 application","year":"2013","key":"ref12"},{"journal-title":"IEC 60730 and UL 1998 safety standard compliance made easier with TI Hercules MCUs","year":"2013","author":"low","key":"ref13"},{"journal-title":"Renesas Application Note","article-title":"RL78 family — VDE certified IEC60730\/60335 self test library","year":"2014","key":"ref14"},{"key":"ref15","article-title":"IEC 60730B Safety Routines for Kinetis MCUs","author":"krenek","year":"2014","journal-title":"Freescale Semiconductor Application Note"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/2.683008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2013.54"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"137","DOI":"10.1109\/OLT.2003.1214380","article-title":"Low-cost online fault detection using control flow assertions","author":"venkatasubramanian","year":"2003","journal-title":"Proc 9th IEEE On-Line Testing Symp"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ASSURE.2013.6614267"},{"journal-title":"2013 Automatic electrical controls — Part 1 General requirements","year":"2013","key":"ref4"},{"journal-title":"Household and similar electrical appliances — Safety — Part 1 General requirements","year":"2010","key":"ref3"},{"key":"ref6","first-page":"18","article-title":"Overall structure","year":"2012","journal-title":"Embedded System development Process Reference guide"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/QR2MSE.2013.6625550"},{"journal-title":"Household and similar electrical appliances — Safety — Part 2-7 Particular requirements for washing machines","year":"2012","key":"ref8"},{"key":"ref7","first-page":"11","article-title":"Software safety lifecycle requirements","year":"1997","journal-title":"IEC 61508 Functional safety of electrical\/electronic\/programmable electronic safety-related systems Part 3 Software requirements version 12 0"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2014.12.002"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2014.03.001"},{"key":"ref9","first-page":"10","article-title":"Process of audit trail, items & evaluation for data exchange among NCB's and CBTL's","year":"2011","journal-title":"Guideline document & work instruction for testing purposes on how to implement the Annex R of IEC 60335-1 and Annex H of IEC 60730-1"},{"journal-title":"Functional safety of electrical\/electronic\/programmable electronic safety-related systems — Part 7 Overview of techniques and measures","year":"0","key":"ref20"}],"event":{"name":"2016 IEEE International Conference on Industrial Technology (ICIT)","start":{"date-parts":[[2016,3,14]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,3,17]]}},"container-title":["2016 IEEE International Conference on Industrial Technology (ICIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7468873\/7474713\/07474721.pdf?arnumber=7474721","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T12:56:35Z","timestamp":1498308995000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7474721\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/icit.2016.7474721","relation":{},"subject":[],"published":{"date-parts":[[2016,3]]}}}