{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T22:46:43Z","timestamp":1725749203177},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/icit.2016.7474745","type":"proceedings-article","created":{"date-parts":[[2016,6,23]],"date-time":"2016-06-23T16:36:46Z","timestamp":1466699806000},"page":"170-174","source":"Crossref","is-referenced-by-count":8,"title":["Inter-turn short fault diagnosis of permanent magnet synchronous machines using negative sequence components"],"prefix":"10.1109","author":[{"given":"Hyeyun","family":"Jeong","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seokbae","family":"Moon","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jewon","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sang Woo","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2015942"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.911960"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2062480"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2089937"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2005.847976"},{"key":"ref15","article-title":"Simple on-line fault detecting scheme for short-circuited turn in a PMSM through current harmonic monitoring","author":"kim","year":"2010","journal-title":"IEEE Trans Ind Electron"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2007529"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2007.4342300"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.816531"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2388493"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2007.05.008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2013.6699564"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2089937"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2005.847955"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2008.4677217"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2029577"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2160514"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2010.5590104"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2265400"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2198077"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1985.319221"}],"event":{"name":"2016 IEEE International Conference on Industrial Technology (ICIT)","start":{"date-parts":[[2016,3,14]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,3,17]]}},"container-title":["2016 IEEE International Conference on Industrial Technology (ICIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7468873\/7474713\/07474745.pdf?arnumber=7474745","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T15:53:56Z","timestamp":1475164436000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7474745\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/icit.2016.7474745","relation":{},"subject":[],"published":{"date-parts":[[2016,3]]}}}