{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,24]],"date-time":"2025-10-24T07:30:22Z","timestamp":1761291022447},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/icit.2016.7474884","type":"proceedings-article","created":{"date-parts":[[2016,6,23]],"date-time":"2016-06-23T16:36:46Z","timestamp":1466699806000},"page":"973-978","source":"Crossref","is-referenced-by-count":5,"title":["Study on recent developments of residual generation design approach based on available process measurements"],"prefix":"10.1109","author":[{"given":"Yuchen","family":"Jiang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ning","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zuyu","family":"Yin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Han","family":"Yu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2015.03.082"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2013.12.018"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2009.01.002"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2015.2481318"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2007.01.005"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2014.2358674"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jlp.2012.10.003"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1080\/00207721.2014.886136"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechatronics.2013.11.009"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(99)00030-X"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2399396"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2009.07.005"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2015.2388958"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2013.08.011"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-6410-4"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2273477"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.009"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2003.09.004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2014.10.008"},{"journal-title":"Fundamental Process Control","year":"1988","author":"david","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(02)00016-1"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2015.08.036"},{"key":"ref21","first-page":"2410","article-title":"A subspace based fault diagnosis method and its application on mechatronics systems","author":"wei","year":"2014","journal-title":"IEEE International Symposium on Industrial Electronics"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2005.09.012"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2006.05.045"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1080\/00207170701684823"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2308133"}],"event":{"name":"2016 IEEE International Conference on Industrial Technology (ICIT)","start":{"date-parts":[[2016,3,14]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,3,17]]}},"container-title":["2016 IEEE International Conference on Industrial Technology (ICIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7468873\/7474713\/07474884.pdf?arnumber=7474884","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T15:55:15Z","timestamp":1475164515000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7474884\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/icit.2016.7474884","relation":{},"subject":[],"published":{"date-parts":[[2016,3]]}}}