{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T00:36:18Z","timestamp":1730248578930,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,2]]},"DOI":"10.1109\/icit.2018.8352398","type":"proceedings-article","created":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T17:34:26Z","timestamp":1525455266000},"page":"1473-1477","source":"Crossref","is-referenced-by-count":0,"title":["Analytical alignment for repairing micro patterns on transparent film in roll-to-roll process"],"prefix":"10.1109","author":[{"given":"HyungTae","family":"Kim","sequence":"first","affiliation":[]},{"given":"Yoon Jae","family":"Moon","sequence":"additional","affiliation":[]},{"given":"Heuiseok","family":"Kang","sequence":"additional","affiliation":[]},{"given":"Jun Young","family":"Hwang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/15599612.2012.760122"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1142\/6123"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2017.2724578"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2014.2366033"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-013-1849-1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1889\/JSID17.11.963"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/jemt.20118"},{"key":"ref17","first-page":"op006","article-title":"Light control for aligning micro patterns on transparent film in rolltoroll printing process","author":"kim","year":"2017","journal-title":"Proc International Symposium on Green Manufacturing and Applications"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"377","DOI":"10.1109\/TASE.2009.2024243","article-title":"Quick Wafer Alignment Using Feedforward Neural Networks","volume":"7","author":"kim","year":"2010","journal-title":"IEEE Transactions on Automation Science and Engineering"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.01.005"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/41.3114"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2708022"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2017.09.051"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2694355"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IEMT.1995.526111"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.solmat.2017.08.038"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/41.103438"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-9625-0"},{"journal-title":"Laser ablation mask repair method","year":"1995","author":"balz","key":"ref9"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.06.005"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.06.008"}],"event":{"name":"2018 IEEE International Conference on Industrial Technology (ICIT)","start":{"date-parts":[[2018,2,20]]},"location":"Lyon","end":{"date-parts":[[2018,2,22]]}},"container-title":["2018 IEEE International Conference on Industrial Technology (ICIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8342303\/8352140\/08352398.pdf?arnumber=8352398","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,29]],"date-time":"2018-05-29T00:03:39Z","timestamp":1527552219000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8352398\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,2]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/icit.2018.8352398","relation":{},"subject":[],"published":{"date-parts":[[2018,2]]}}}