{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T15:51:12Z","timestamp":1725724272037},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,2]]},"DOI":"10.1109\/icit.2019.8754957","type":"proceedings-article","created":{"date-parts":[[2019,7,4]],"date-time":"2019-07-04T18:14:55Z","timestamp":1562264095000},"page":"773-779","source":"Crossref","is-referenced-by-count":2,"title":["Analysis of Industrial Control System Software to Detect Semantic Clones"],"prefix":"10.1109","author":[{"given":"H.K.","family":"Jnanamurthy","sequence":"first","affiliation":[]},{"given":"Raoul","family":"Jetley","sequence":"additional","affiliation":[]},{"given":"Frans","family":"Henskens","sequence":"additional","affiliation":[]},{"given":"David","family":"Paul","sequence":"additional","affiliation":[]},{"given":"Mark","family":"Wallis","sequence":"additional","affiliation":[]},{"given":"S.D.","family":"Sudarsan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/WCRE.2006.1"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"227","DOI":"10.1109\/ICSME.2017.33","article-title":"Bug propagation through code cloning: An empirical study","author":"mondal","year":"2017","journal-title":"Software Maintenance and Evolution (ICSME) 2017 IEEE International Conference on"},{"key":"ref12","first-page":"256","author":"fowler","year":"2002","journal-title":"Refactoring Improving the Design of Existing Code"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2018.8330196"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/WAC.2014.6936062"},{"key":"ref15","first-page":"vi","author":"karl-heinz john","year":"2010","journal-title":"IEC 61131-3 Programming Industrial Automation Systems"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME.2014.54"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2002.1019480"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2009.5070566"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IWSC.2012.6227881"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2018.00021"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.1998.738528"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IWSC.2018.8327312"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2002.1019480"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/I2CT.2018.8529446"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2018.8330194"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2017.97"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISESE.2004.1334896"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAIE.2018.8405504"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CSMR.2009.20"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884877"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2007.30"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLA.2016.0185"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2015.7081856"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICPC.2008.41"}],"event":{"name":"2019 IEEE International Conference on Industrial Technology (ICIT)","start":{"date-parts":[[2019,2,13]]},"location":"Melbourne, VIC, Australia","end":{"date-parts":[[2019,2,15]]}},"container-title":["2019 IEEE International Conference on Industrial Technology (ICIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8746085\/8754907\/08754957.pdf?arnumber=8754957","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,14]],"date-time":"2022-07-14T23:14:01Z","timestamp":1657840441000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8754957\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,2]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/icit.2019.8754957","relation":{},"subject":[],"published":{"date-parts":[[2019,2]]}}}