{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:27:38Z","timestamp":1740101258869,"version":"3.37.3"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,8,22]],"date-time":"2022-08-22T00:00:00Z","timestamp":1661126400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,8,22]],"date-time":"2022-08-22T00:00:00Z","timestamp":1661126400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,8,22]]},"DOI":"10.1109\/icit48603.2022.10002759","type":"proceedings-article","created":{"date-parts":[[2023,1,5]],"date-time":"2023-01-05T19:09:43Z","timestamp":1672945783000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Latent Factor Learning Under Multiple Rating Patterns for Undirected, Large-Scaled and Sparse Networks"],"prefix":"10.1109","author":[{"given":"Ming","family":"Li","sequence":"first","affiliation":[{"name":"University of Shanghai for Science and Technology,Department of Control Science and Engineering,Shanghai,China,200093"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jing","family":"Wu","sequence":"additional","affiliation":[{"name":"University of Shanghai for Science and Technology,School of Science,Shanghai,China,200093"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yan","family":"Song","sequence":"additional","affiliation":[{"name":"University of Shanghai for Science and Technology,Department of Control Science and Engineering,Shanghai,China,200093"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bohui","family":"Wang","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore,639798"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-017-9334-3"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-019-9936-y"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/s16050722"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2724769"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2020.2990990"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2908958"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-020-3080-3"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.artint.2013.01.003"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MIS.2014.2"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2019.2894137"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1401890.1401969"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2875452"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tsmc.2019.2930525"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2766528"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2019.2894283"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2015.2415257"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2021.3130289"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tsmc.2021.3135580"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2011.217"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/1390334.1390387"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1561\/2200000016"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3123266.3123361"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/0893-6080(88)90023-8"}],"event":{"name":"2022 IEEE International Conference on Industrial Technology (ICIT)","start":{"date-parts":[[2022,8,22]]},"location":"Shanghai, China","end":{"date-parts":[[2022,8,25]]}},"container-title":["2022 IEEE International Conference on Industrial Technology (ICIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10002706\/10002716\/10002759.pdf?arnumber=10002759","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,9]],"date-time":"2024-02-09T03:56:09Z","timestamp":1707450969000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10002759\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8,22]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/icit48603.2022.10002759","relation":{},"subject":[],"published":{"date-parts":[[2022,8,22]]}}}