{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T00:32:45Z","timestamp":1730248365617,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T00:00:00Z","timestamp":1711324800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,3,25]]},"DOI":"10.1109\/icit58233.2024.10540716","type":"proceedings-article","created":{"date-parts":[[2024,6,5]],"date-time":"2024-06-05T17:38:41Z","timestamp":1717609121000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["VAEPose: 6D Pose Estimation with Visual Appearance Enhancement for Low-Light Conditions"],"prefix":"10.1109","author":[{"given":"Yan","family":"Gao","sequence":"first","affiliation":[{"name":"Insti. of Big Data Science & Industry, School of Computer & Information Tech., Shanxi University,Taiyuan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lu","family":"Chen","sequence":"additional","affiliation":[{"name":"Insti. of Big Data Science & Industry, School of Computer & Information Tech., Shanxi University,Taiyuan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jingyang","family":"Liu","sequence":"additional","affiliation":[{"name":"Insti. of Big Data Science & Industry, School of Computer & Information Tech., Shanxi University,Taiyuan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2020.3048441"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IVS.2011.5940562"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVCG.2015.2513408"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/34.9107"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00346"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01165"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00302"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-44195-0_14"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2023.3330664"},{"key":"ref10","article-title":"Deep retinex decomposition for low-light enhancement","author":"Wei","year":"2018","journal-title":"arXiv preprint"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01042"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00185"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2021.3051462"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.15607\/rss.2018.xiv.019"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00469"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00350"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2022.104618"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLA51294.2020.00021"},{"key":"ref19","article-title":"Pointnet++: Deep hierarchical feature learning on point sets in a metric space","volume":"30","author":"Qi","year":"2017","journal-title":"Advances in Neural Information Processing Systems"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/34.1000236"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1987.4767965"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CRV.2018.00013"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"}],"event":{"name":"2024 IEEE International Conference on Industrial Technology (ICIT)","start":{"date-parts":[[2024,3,25]]},"location":"Bristol, United Kingdom","end":{"date-parts":[[2024,3,27]]}},"container-title":["2024 IEEE International Conference on Industrial Technology (ICIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10540646\/10540608\/10540716.pdf?arnumber=10540716","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,29]],"date-time":"2024-07-29T17:38:42Z","timestamp":1722274722000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10540716\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3,25]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/icit58233.2024.10540716","relation":{},"subject":[],"published":{"date-parts":[[2024,3,25]]}}}