{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,24]],"date-time":"2026-04-24T15:12:59Z","timestamp":1777043579796,"version":"3.51.4"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,4]],"date-time":"2023-04-04T00:00:00Z","timestamp":1680566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,4]],"date-time":"2023-04-04T00:00:00Z","timestamp":1680566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4,4]]},"DOI":"10.1109\/icit58465.2023.10143147","type":"proceedings-article","created":{"date-parts":[[2023,6,9]],"date-time":"2023-06-09T17:21:52Z","timestamp":1686331312000},"page":"1-6","source":"Crossref","is-referenced-by-count":9,"title":["A Deep Multi-Modal Cyber-Attack Detection in Industrial Control Systems"],"prefix":"10.1109","author":[{"given":"Sepideh","family":"Bahadoripour","sequence":"first","affiliation":[{"name":"Schulich School of Engineering, University of Calgary,Calgary,Canada"}]},{"given":"Ethan","family":"MacDonald","sequence":"additional","affiliation":[{"name":"Schulich School of Engineering, University of Calgary,Calgary,Canada"}]},{"given":"Hadis","family":"Karimipour","sequence":"additional","affiliation":[{"name":"Schulich School of Engineering, University of Calgary,Calgary,Canada"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.phycom.2021.101394"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2019.2912022"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2891261"},{"key":"ref4","volume-title":"50,000 security disasters waiting to happen: The problem of Americas water supplies","author":"Collier","year":"2021"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3133361"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2019.2919635"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-38557-6_7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2725482"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2012.2185911"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2018.2800908"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2016.2633228"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2015.2443793"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cps.2019.0031"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s13748-016-0094-0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/SEGE.2019.8859946"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2020.101935"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/SMC42975.2020.9283064"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.comcom.2022.04.004"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2017.2703842"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2804669"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.2991693"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2920326"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110145"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3067667"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.adhoc.2022.102930"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijcip.2022.100508"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/PST52912.2021.9647838"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.comcom.2022.11.009"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2021.3050101"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-71368-7_8"}],"event":{"name":"2023 IEEE International Conference on Industrial Technology (ICIT)","location":"Orlando, FL, USA","start":{"date-parts":[[2023,4,4]]},"end":{"date-parts":[[2023,4,6]]}},"container-title":["2023 IEEE International Conference on Industrial Technology (ICIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10143075\/10143030\/10143147.pdf?arnumber=10143147","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T02:16:05Z","timestamp":1705025765000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10143147\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4,4]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/icit58465.2023.10143147","relation":{},"subject":[],"published":{"date-parts":[[2023,4,4]]}}}