{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,18]],"date-time":"2026-01-18T15:29:33Z","timestamp":1768750173243,"version":"3.49.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T00:00:00Z","timestamp":1742947200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T00:00:00Z","timestamp":1742947200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,26]]},"DOI":"10.1109\/icit63637.2025.10965264","type":"proceedings-article","created":{"date-parts":[[2025,4,22]],"date-time":"2025-04-22T17:38:10Z","timestamp":1745343490000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Conductivity Invariant Phenomenon of Eddy Current Sensor: Metal Magnetic Permeability and Probe Parameters"],"prefix":"10.1109","author":[{"given":"Fenglong","family":"Wang","sequence":"first","affiliation":[{"name":"School of Mechanical and Electrical Engineering University of Electronic Science and Technology of China,Chengdu,China,611731"}]},{"given":"Jianhui","family":"Ma","sequence":"additional","affiliation":[{"name":"Aero Engine Corporation of China Sichuan Gas Turbine Research Institute,Mianyang,China,621000"}]},{"given":"Fengying","family":"Zeng","sequence":"additional","affiliation":[{"name":"Aero Engine Corporation of China Sichuan Gas Turbine Research Institute,Mianyang,China,621000"}]},{"given":"Yating","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering University of Electronic Science and Technology of China State Key Laboratory of Rail Transit Vehicle System Southwest Jiaotong University,Chengdu,China,611731"}]},{"given":"Cheng","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering University of Electronic Science and Technology of China Jiangxi Busbar New Energy Technology Co., Ltd,Chengdu,China,611731"}]},{"given":"Haipeng","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering University of Electronic Science and Technology of China,Chengdu,China,611731"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/s24175819"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2017.59.4.176"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3060390"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.compositesb.2021.109167"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jngse.2022.104568"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3188863"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/app14104326"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2024.114892"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2872386"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/10589759.2023.2198234"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmst.2018.09.047"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2011.5944208"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2225634"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/FENDT.2015.7398350"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2616328"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2018.01.007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3007216"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2022.102694"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/s22072503"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s23146610"},{"issue":"3","key":"ref21","first-page":"100","article-title":"Parameter setting basis for eddy current testing systems","volume":"23","author":"Jiang","year":"2001","journal-title":"Nondestructive Testing"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/10589759.2010.521827"}],"event":{"name":"2025 IEEE International Conference on Industrial Technology (ICIT)","location":"Wuhan, China","start":{"date-parts":[[2025,3,26]]},"end":{"date-parts":[[2025,3,28]]}},"container-title":["2025 IEEE International Conference on Industrial Technology (ICIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10965190\/10965119\/10965264.pdf?arnumber=10965264","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,23]],"date-time":"2025-04-23T17:51:17Z","timestamp":1745430677000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10965264\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,26]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/icit63637.2025.10965264","relation":{},"subject":[],"published":{"date-parts":[[2025,3,26]]}}}