{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T00:44:06Z","timestamp":1730249046226,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,12]]},"DOI":"10.1109\/icm.2016.7847862","type":"proceedings-article","created":{"date-parts":[[2017,2,9]],"date-time":"2017-02-09T16:43:31Z","timestamp":1486658611000},"page":"249-252","source":"Crossref","is-referenced-by-count":2,"title":["Towards an automated and reusable in-field self-test solution for MPSoCs"],"prefix":"10.1109","author":[{"given":"Ahmed","family":"Ibrahim","sequence":"first","affiliation":[]},{"given":"Hans G.","family":"Kerkhoff","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"120","article-title":"Generation of Vector Patterns Through Reseeding of Multiple-Polynomial Linear Feedback Shift Register","author":"hellebrand","year":"1992","journal-title":"International Test Conference (ITC)"},{"year":"2005","key":"ref3"},{"journal-title":"AN5131 Using the Built-in Self-Test (BIST) on the MPC5777M","article-title":"NXP","year":"2015","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2009.152"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DELTA.2010.57"},{"key":"ref7","first-page":"2983","article-title":"An embedded processor based SOC test platform","volume":"3","author":"lee","year":"2005","journal-title":"IEEE International Symposium on Circuits and Systems"},{"year":"2014","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2016.7519301"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.24"}],"event":{"name":"2016 28th International Conference on Microelectronics (ICM)","start":{"date-parts":[[2016,12,17]]},"location":"Giza, Egypt","end":{"date-parts":[[2016,12,20]]}},"container-title":["2016 28th International Conference on Microelectronics (ICM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7835397\/7847841\/07847862.pdf?arnumber=7847862","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,1]],"date-time":"2017-03-01T17:33:05Z","timestamp":1488389585000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7847862\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,12]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/icm.2016.7847862","relation":{},"subject":[],"published":{"date-parts":[[2016,12]]}}}